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Title: Active control of bright electron beams with RF optics for femtosecond microscopy

A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. In this paper, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensity beam column for condensing the electron beams both temporally and spectrally, relevant to the design of ultrafast electron microscopy. Through the introduction of a novel atomic grating approach for characterization of electron bunch phase space and control optics, we elucidate the principles for predicting and controlling the phase space dynamics to reach optimal compressions at various electron densities and generating conditions. We provide strategies to identify high-brightness modes, achieving ~100 fs and ~1 eV resolutions with 10 6 electrons per bunch, and establish the scaling of performance for different bunch charges. These results benchmark the sensitivity and resolution from the fundamental beam brightness perspective and also validate the adaptive optics concept to enable delicate control of the density-dependent phase space structures to optimize the performance, including delivering ultrashort, monochromatic, high-dose, or coherent electron bunches.
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  1. Michigan State Univ., East Lansing, MI (United States). Dept. of Physics and Astronomy
Publication Date:
Grant/Contract Number:
FG02-06ER46309; FG02-08ER41546; 1126343; 1625181
Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 4; Journal Issue: 4; Journal ID: ISSN 2329-7778
American Crystallographic Association/AIP
Research Org:
Michigan State Univ., East Lansing, MI (United States)
Sponsoring Org:
USDOE; SOLEIL, Saint-Aubin (France); JILA, Boulder, CO (United States); National Science Foundation (NSF)
Country of Publication:
United States
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; dielectrics; microscopy; spectroscopy; condensed matter properties; optical elements; lasers; chemical analysis; intense particle beams; materials analysis; electron energy loss spectroscopy
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1375661