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Title: Active control of bright electron beams with RF optics for femtosecond microscopy

Abstract

A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. In this paper, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensity beam column for condensing the electron beams both temporally and spectrally, relevant to the design of ultrafast electron microscopy. Through the introduction of a novel atomic grating approach for characterization of electron bunch phase space and control optics, we elucidate the principles for predicting and controlling the phase space dynamics to reach optimal compressions at various electron densities and generating conditions. We provide strategies to identify high-brightness modes, achieving ~100 fs and ~1 eV resolutions with 106 electrons per bunch, and establish the scaling of performance for different bunch charges. These results benchmark the sensitivity and resolution from the fundamental beam brightness perspective and also validate the adaptive optics concept to enable delicate control of the density-dependent phase space structures to optimize the performance, including delivering ultrashort, monochromatic, high-dose, or coherent electron bunches.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
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  1. Michigan State Univ., East Lansing, MI (United States). Dept. of Physics and Astronomy
Publication Date:
Research Org.:
Michigan State Univ., East Lansing, MI (United States)
Sponsoring Org.:
USDOE; SOLEIL, Saint-Aubin (France); JILA, Boulder, CO (United States); National Science Foundation (NSF)
OSTI Identifier:
1430127
Alternate Identifier(s):
OSTI ID: 1375661
Grant/Contract Number:  
FG02-06ER46309; FG02-08ER41546; 1126343; 1625181
Resource Type:
Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 4; Journal Issue: 4; Journal ID: ISSN 2329-7778
Publisher:
American Crystallographic Association/AIP
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; dielectrics; microscopy; spectroscopy; condensed matter properties; optical elements; lasers; chemical analysis; intense particle beams; materials analysis; electron energy loss spectroscopy

Citation Formats

Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., and Ruan, C. -Y. Active control of bright electron beams with RF optics for femtosecond microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4999456.
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Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., & Ruan, C. -Y. Active control of bright electron beams with RF optics for femtosecond microscopy. United States. https://doi.org/10.1063/1.4999456
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Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., and Ruan, C. -Y. Tue . "Active control of bright electron beams with RF optics for femtosecond microscopy". United States. https://doi.org/10.1063/1.4999456. https://www.osti.gov/servlets/purl/1430127.
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@article{osti_1430127,
title = {Active control of bright electron beams with RF optics for femtosecond microscopy},
author = {Williams, J. and Zhou, F. and Sun, T. and Tao, Z. and Chang, K. and Makino, K. and Berz, M. and Duxbury, P. M. and Ruan, C. -Y.},
abstractNote = {A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. In this paper, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensity beam column for condensing the electron beams both temporally and spectrally, relevant to the design of ultrafast electron microscopy. Through the introduction of a novel atomic grating approach for characterization of electron bunch phase space and control optics, we elucidate the principles for predicting and controlling the phase space dynamics to reach optimal compressions at various electron densities and generating conditions. We provide strategies to identify high-brightness modes, achieving ~100 fs and ~1 eV resolutions with 106 electrons per bunch, and establish the scaling of performance for different bunch charges. These results benchmark the sensitivity and resolution from the fundamental beam brightness perspective and also validate the adaptive optics concept to enable delicate control of the density-dependent phase space structures to optimize the performance, including delivering ultrashort, monochromatic, high-dose, or coherent electron bunches.},
doi = {10.1063/1.4999456},
journal = {Structural Dynamics},
number = 4,
volume = 4,
place = {United States},
year = {Tue Aug 01 00:00:00 EDT 2017},
month = {Tue Aug 01 00:00:00 EDT 2017}
}
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https://doi.org/10.1063/1.4999456
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Femtosecond electron pulse propagation for ultrafast electron diffraction
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Transmission-electron diffraction by MeV electron pulses
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Space charge effects in ultrafast electron diffraction and imaging
journal, February 2012

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Ultrafast electron diffraction with radio-frequency compressed electron pulses
journal, August 2012

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Computational and experimental characterization of high-brightness beams for femtosecond electron imaging and spectroscopy
journal, December 2013

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Untangling the contributions of image charge and laser profile for optimal photoemission of high-brightness electron beams
journal, November 2014

  • Portman, J.; Zhang, H.; Makino, K.
  • Journal of Applied Physics, Vol. 116, Issue 17
  • DOI: 10.1063/1.4900582

Ultrafast core-loss spectroscopy in four-dimensional electron microscopy
journal, March 2015

  • van der Veen, Renske M.; Penfold, Thomas J.; Zewail, Ahmed H.
  • Structural Dynamics, Vol. 2, Issue 2
  • DOI: 10.1063/1.4916897

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory
journal, July 2015

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100 years of the physics of diodes
journal, March 2017

  • Zhang, Peng; Valfells, Ágúst; Ang, L. K.
  • Applied Physics Reviews, Vol. 4, Issue 1
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Four-dimensional ultrafast electron microscopy
journal, May 2005

  • Lobastov, V. A.; Srinivasan, R.; Zewail, A. H.
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Femtosecond electron diffraction: heralding the era of atomically resolved dynamics
journal, August 2011

Exploration of metastability and hidden phases in correlated electron crystals visualized by femtosecond optical doping and electron crystallography
journal, June 2015

  • Han, Tzong-Ru T.; Zhou, Faran; Malliakas, Christos D.
  • Science Advances, Vol. 1, Issue 5
  • DOI: 10.1126/sciadv.1400173

An Atomic-Level View of Melting Using Femtosecond Electron Diffraction
journal, November 2003

  • Siwick, Bradley J.; Dwyer, Jason R.; Jordan, Robert E.
  • Science, Vol. 302, Issue 5649
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Ultrafast Electron Crystallography of Interfacial Water
journal, April 2004

Four-Dimensional Electron Microscopy
journal, April 2010

Ultrafast Electron Optics: Propagation Dynamics of Femtosecond Electron Packets
conference, January 2002

  • Siwick, Bradley J.; Dwyer, Jason R.; Jordan, Robert E.
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text, January 2015

  • T., O'Callahan, Brian; Jae, Hyung Park,; H., Cobden, David
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Shaping, imaging and controlling plasmonic interference fields at buried interfaces
text, January 2016

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