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Title: High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

Abstract

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1427249
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, and Kim, Jung Ho. High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering. United States: N. p., 2018. Web. doi:10.1107/S1600577517018185.
Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, & Kim, Jung Ho. High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering. United States. https://doi.org/10.1107/S1600577517018185
Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, and Kim, Jung Ho. Thu . "High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering". United States. https://doi.org/10.1107/S1600577517018185. https://www.osti.gov/servlets/purl/1427249.
@article{osti_1427249,
title = {High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering},
author = {Said, Ayman H. and Gog, Thomas and Wieczorek, Michael and Huang, XianRong and Casa, Diego and Kasman, Elina and Divan, Ralu and Kim, Jung Ho},
abstractNote = {A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.},
doi = {10.1107/S1600577517018185},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 25,
place = {United States},
year = {Thu Feb 15 00:00:00 EST 2018},
month = {Thu Feb 15 00:00:00 EST 2018}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 9 works
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Figures / Tables:

Fig. 1. Fig. 1. : Analyzer energy resolution for different crystal analyzer materials at the Ir L3 absorption edge (E=11.215 keV), the length of the dash marker for each reflection represents the relative integrated reflectivity. The analyzer energy resolution shown in the figure is approximated as ∆$E$$a$= $\sqrt{∆E^{2}_{i}$ + ∆E^{2}_{g}}$ , wheremore » ∆$E$$i$ and ∆$E$$g$ are the intrinsic and detector geometrical contributions respectively, the latter calculated for a 2 m diameter Rowland circle and a strip detector pitch of 50 µm. These contributions are described in more detail in earlier work (Gog et al., 2013).« less

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Works referenced in this record:

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Works referencing / citing this record:

X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?
journal, October 2019

  • Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond
  • Journal of Applied Crystallography, Vol. 52, Issue 6
  • DOI: 10.1107/s1600576719012925

Performance of quartz- and sapphire-based double-crystal high-resolution (∼10 meV) RIXS monochromators under varying power loads
text, January 2018

  • Gog, Thomas; Casa, Diego M.; Knopp, Jonathan
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2019-00184

Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.