Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
Abstract
Quartz tuning forks that have a probe tip attached to the end of one of its prongs while the other prong is arrested to a holder (“qPlus” configuration) have gained considerable popularity in recent years for high-resolution atomic force microscopy imaging. The small size of the tuning forks and the complexity of the sensor architecture, however, often impede predictions on how variations in the execution of the individual assembly steps affect the performance of the completed sensor. Extending an earlier study that provided numerical analysis of qPlus-style setups without tips, this work quantifies the influence of tip attachment on the operational characteristics of the sensor. The results using finite element modeling show in particular that for setups that include a metallic tip that is connected via a separate wire to enable the simultaneous collection of local forces and tunneling currents, the exact realization of this wire connection has a major effect on sensor properties such as spring constant, quality factor, resonance frequency, and its deviation from an ideal vertical oscillation.
- Authors:
-
- Yale Univ., New Haven, CT (United States)
- Publication Date:
- Research Org.:
- Yale Univ., New Haven, CT (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1426778
- Grant/Contract Number:
- sC0016179
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Beilstein Journal of Nanotechnology
- Additional Journal Information:
- Journal Volume: 8; Journal ID: ISSN 2190-4286
- Publisher:
- Beilstein Institute
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; force sensor; noncontact atomic force microscopy; quartz tuning forks; scanning tunneling microscopy; self-sensing probe
Citation Formats
Dagdeviren, Omur E., and Schwarz, Udo D. Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis. United States: N. p., 2017.
Web. doi:10.3762/bjnano.8.70.
Dagdeviren, Omur E., & Schwarz, Udo D. Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis. United States. https://doi.org/10.3762/bjnano.8.70
Dagdeviren, Omur E., and Schwarz, Udo D. Mon .
"Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis". United States. https://doi.org/10.3762/bjnano.8.70. https://www.osti.gov/servlets/purl/1426778.
@article{osti_1426778,
title = {Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis},
author = {Dagdeviren, Omur E. and Schwarz, Udo D.},
abstractNote = {Quartz tuning forks that have a probe tip attached to the end of one of its prongs while the other prong is arrested to a holder (“qPlus” configuration) have gained considerable popularity in recent years for high-resolution atomic force microscopy imaging. The small size of the tuning forks and the complexity of the sensor architecture, however, often impede predictions on how variations in the execution of the individual assembly steps affect the performance of the completed sensor. Extending an earlier study that provided numerical analysis of qPlus-style setups without tips, this work quantifies the influence of tip attachment on the operational characteristics of the sensor. The results using finite element modeling show in particular that for setups that include a metallic tip that is connected via a separate wire to enable the simultaneous collection of local forces and tunneling currents, the exact realization of this wire connection has a major effect on sensor properties such as spring constant, quality factor, resonance frequency, and its deviation from an ideal vertical oscillation.},
doi = {10.3762/bjnano.8.70},
journal = {Beilstein Journal of Nanotechnology},
number = ,
volume = 8,
place = {United States},
year = {Mon Mar 20 00:00:00 EDT 2017},
month = {Mon Mar 20 00:00:00 EDT 2017}
}
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journal, March 2011
- Gross, Leo
- Nature Chemistry, Vol. 3, Issue 4
Three-dimensional imaging of short-range chemical forces with picometre resolution
journal, April 2009
- Albers, Boris J.; Schwendemann, Todd C.; Baykara, Mehmet Z.
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Imaging the charge distribution within a single molecule
journal, February 2012
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Operation characteristics of piezoelectric quartz tuning forks in high magnetic fields at liquid helium temperatures
journal, April 2000
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High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
journal, December 1998
- Giessibl, Franz J.
- Applied Physics Letters, Vol. 73, Issue 26
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journal, February 2005
- Morville, Jérôme; Liu, Jinquan; Callegari, Andrea
- Applied Physics Letters, Vol. 86, Issue 6
Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator
journal, September 2005
- An, Toshu; Eguchi, Toyoaki; Akiyama, Kotone
- Applied Physics Letters, Vol. 87, Issue 13
Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy
journal, March 2008
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Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy
journal, February 2011
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Recipes for cantilever parameter determination in dynamic force spectroscopy: spring constant and amplitude
journal, June 2007
- Simon, Georg Hermann; Heyde, Markus; Rust, Hans-Peter
- Nanotechnology, Vol. 18, Issue 25
Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite
journal, November 2016
- Dagdeviren, Omur E.; Götzen, Jan; Altman, Eric I.
- Nanotechnology, Vol. 27, Issue 48
Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016
- Dagdeviren, Omur E.; Götzen, Jan; Hölscher, Hendrik
- Nanotechnology, Vol. 27, Issue 6
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journal, June 2009
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journal, August 2009
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journal, January 1995
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Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
journal, December 1995
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Works referencing / citing this record:
The qPlus sensor, a powerful core for the atomic force microscope
journal, January 2019
- Giessibl, Franz J.
- Review of Scientific Instruments, Vol. 90, Issue 1
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
journal, January 2019
- Dagdeviren, Omur E.; Miyahara, Yoichi; Mascaro, Aaron
- Review of Scientific Instruments, Vol. 90, Issue 1
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
journal, March 2019
- Dagdeviren, Omur E.; Schwarz, Udo D.
- Review of Scientific Instruments, Vol. 90, Issue 3
Torque Differential Magnetometry Using the qPlus Mode of a Quartz Tuning Fork
journal, February 2018
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Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
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Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy
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Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy
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