Solid state dewetting of thin plasmonic films under focused cw-laser irradiation
Abstract
Elevated temperatures and large thermal gradients are a significant source of component failure in microelectronics, and is the limiting factor in heat-assisted magnetic recording (HAMR). Here, we have investigated the effect of solid-state dewetting in Au thin films, as a function of local temperature, film thickness, and substrate adhesion. In this work, a localised temperature rise is induced in thin (≤ 50 nm) polycrystalline Au films on SiO2 substrates via focused continuous-wave laser irradiation at 488 nm. The magnitude and distribution of the total temperature rise is measured using CCD-based thermoreflectance. This also allows a sensitive measurement of the temperature at which dewetting occurs, showing that for thin (≤ 50 nm) Au films without adhesion layers, rapid dewetting can occur at temperatures as low as 50° C. The time decay of the reflected light from the illuminating laser is used to monitor locally the dynamics of solid state dewetting. TEM diffraction analysis shows significant changes in the microstructure and crystallographic texture of the films as far as 10 µm away from the illuminated area. The use of a thin metallic adhesion layer (such as Ti or Cr) is shown to significantly improve the adhesion of the Au to the substratemore »
- Authors:
-
- Trinity College Dublin, Dublin (Ireland). School of Physics, CRANN and AMBER
- Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division; Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
- Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; Science Foundation Ireland (SFI); Western Digital Technologies, Inc.; USDOE
- OSTI Identifier:
- 1416974
- Alternate Identifier(s):
- OSTI ID: 1496407
- Grant/Contract Number:
- AC02-06CH11357; SFI/12/RC/2278
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Acta Materialia
- Additional Journal Information:
- Journal Volume: 145; Journal Issue: C; Journal ID: ISSN 1359-6454
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Solid-state dewetting; crystallographic texture evolution; gold thin-films; substrate adhesion; temperature
Citation Formats
Abbott, William M., Corbett, Simon, Cunningham, Graeme, Petford-Long, Amanda, Zhang, Sheng, Donegan, John F., and McCloskey, David. Solid state dewetting of thin plasmonic films under focused cw-laser irradiation. United States: N. p., 2017.
Web. doi:10.1016/j.actamat.2017.12.030.
Abbott, William M., Corbett, Simon, Cunningham, Graeme, Petford-Long, Amanda, Zhang, Sheng, Donegan, John F., & McCloskey, David. Solid state dewetting of thin plasmonic films under focused cw-laser irradiation. United States. https://doi.org/10.1016/j.actamat.2017.12.030
Abbott, William M., Corbett, Simon, Cunningham, Graeme, Petford-Long, Amanda, Zhang, Sheng, Donegan, John F., and McCloskey, David. Thu .
"Solid state dewetting of thin plasmonic films under focused cw-laser irradiation". United States. https://doi.org/10.1016/j.actamat.2017.12.030. https://www.osti.gov/servlets/purl/1416974.
@article{osti_1416974,
title = {Solid state dewetting of thin plasmonic films under focused cw-laser irradiation},
author = {Abbott, William M. and Corbett, Simon and Cunningham, Graeme and Petford-Long, Amanda and Zhang, Sheng and Donegan, John F. and McCloskey, David},
abstractNote = {Elevated temperatures and large thermal gradients are a significant source of component failure in microelectronics, and is the limiting factor in heat-assisted magnetic recording (HAMR). Here, we have investigated the effect of solid-state dewetting in Au thin films, as a function of local temperature, film thickness, and substrate adhesion. In this work, a localised temperature rise is induced in thin (≤ 50 nm) polycrystalline Au films on SiO2 substrates via focused continuous-wave laser irradiation at 488 nm. The magnitude and distribution of the total temperature rise is measured using CCD-based thermoreflectance. This also allows a sensitive measurement of the temperature at which dewetting occurs, showing that for thin (≤ 50 nm) Au films without adhesion layers, rapid dewetting can occur at temperatures as low as 50° C. The time decay of the reflected light from the illuminating laser is used to monitor locally the dynamics of solid state dewetting. TEM diffraction analysis shows significant changes in the microstructure and crystallographic texture of the films as far as 10 µm away from the illuminated area. The use of a thin metallic adhesion layer (such as Ti or Cr) is shown to significantly improve the adhesion of the Au to the substrate and reduce the tendency towards dewetting, but does not entirely protect it from changes to the crystallographic texture.},
doi = {10.1016/j.actamat.2017.12.030},
journal = {Acta Materialia},
number = C,
volume = 145,
place = {United States},
year = {Thu Dec 21 00:00:00 EST 2017},
month = {Thu Dec 21 00:00:00 EST 2017}
}
Web of Science
Figures / Tables:
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Works referencing / citing this record:
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