Microprobe Analysis of Pu-Ga Standards

Wall, Angélique D.; Romero, Joseph P.; Schwartz, Daniel

doi:10.1017/S1431927617003312

Title: Microprobe Analysis of Pu-Ga Standards

Abstract

In order to obtain quantitative analysis using an Electron Scanning Microprobe it is essential to have a standard of known composition. Most elemental and multi-elemental standards can be easily obtained from places like Elemental Scientific or other standards organizations that are NIST (National Institute of Standards and Technology) traceable. It is, however, more challenging to find standards for plutonium. Past work performed in our group has typically involved using the plutonium sample to be analysed as its own standard as long as all other known components of the sample have standards to be compared to [1,2,3]. Finally, this method works well enough, but this experiment was performed in order to develop a more reliable standard for plutonium using five samples of known chemistry of a plutonium gallium mix that could then be used as the main plutonium and gallium standards for future experiments.

Authors:

Wall, Angélique D. ^[1]; Romero, Joseph P. ^[1]; Schwartz, Daniel ^[1]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Publication Date:: Fri Aug 04 00:00:00 EDT 2017

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1409761

Report Number(s):: LA-UR-16-21493
Journal ID: ISSN 1431-9276

Grant/Contract Number:: AC52-06NA25396

Resource Type:: Accepted Manuscript

Journal Name:: Microscopy and Microanalysis

Additional Journal Information:: Journal Volume: 23; Journal Issue: S1; Journal ID: ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY

Citation Formats


                    Wall, Angélique D., Romero, Joseph P., and Schwartz, Daniel. Microprobe Analysis of Pu-Ga Standards.  United States: N. p., 2017. 
Web.  doi:10.1017/S1431927617003312.

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                    Wall, Angélique D., Romero, Joseph P., & Schwartz, Daniel. Microprobe Analysis of Pu-Ga Standards.  United States.  https://doi.org/10.1017/S1431927617003312

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                    Wall, Angélique D., Romero, Joseph P., and Schwartz, Daniel. Fri .  
"Microprobe Analysis of Pu-Ga Standards".  United States.  https://doi.org/10.1017/S1431927617003312.  https://www.osti.gov/servlets/purl/1409761.

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@article{osti_1409761,

  title        = {Microprobe Analysis of Pu-Ga Standards},

  author       = {Wall, Angélique D. and Romero, Joseph P. and Schwartz, Daniel},

  abstractNote = {In order to obtain quantitative analysis using an Electron Scanning Microprobe it is essential to have a standard of known composition. Most elemental and multi-elemental standards can be easily obtained from places like Elemental Scientific or other standards organizations that are NIST (National Institute of Standards and Technology) traceable. It is, however, more challenging to find standards for plutonium. Past work performed in our group has typically involved using the plutonium sample to be analysed as its own standard as long as all other known components of the sample have standards to be compared to [1,2,3]. Finally, this method works well enough, but this experiment was performed in order to develop a more reliable standard for plutonium using five samples of known chemistry of a plutonium gallium mix that could then be used as the main plutonium and gallium standards for future experiments.},

  doi          = {10.1017/S1431927617003312},

  journal      = {Microscopy and Microanalysis},

  number       = S1,

  volume       = 23,

  place        = {United States},

  year         = {Fri Aug 04 00:00:00 EDT 2017},

  month        = {Fri Aug 04 00:00:00 EDT 2017}

}

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Journal Article:

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Works referenced in this record:

Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium
journal, July 2011

Neuman, A.; Nothwang, T.; Hampel, F.
Microscopy and Microanalysis, Vol. 17, Issue S2
DOI: 10.1017/S143192761100609X

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