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Title: Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

Abstract

Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i.e. image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials.

Authors:
 [1];  [2];  [3];  [1];  [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences. Inst. for Functional Imaging of Materials
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials. Materials Science and Technology Division
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); ORNL Laboratory Directed Research and Development (LDRD) Program
OSTI Identifier:
1394477
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 7; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; transmission electron microscopy

Citation Formats

Sang, Xiahan, Lupini, Andrew R., Ding, Jilai, Kalinin, Sergei V., Jesse, Stephen, and Unocic, Raymond R. Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways. United States: N. p., 2017. Web. doi:10.1038/srep43585.
Sang, Xiahan, Lupini, Andrew R., Ding, Jilai, Kalinin, Sergei V., Jesse, Stephen, & Unocic, Raymond R. Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways. United States. doi:10.1038/srep43585.
Sang, Xiahan, Lupini, Andrew R., Ding, Jilai, Kalinin, Sergei V., Jesse, Stephen, and Unocic, Raymond R. Wed . "Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways". United States. doi:10.1038/srep43585. https://www.osti.gov/servlets/purl/1394477.
@article{osti_1394477,
title = {Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways},
author = {Sang, Xiahan and Lupini, Andrew R. and Ding, Jilai and Kalinin, Sergei V. and Jesse, Stephen and Unocic, Raymond R.},
abstractNote = {Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i.e. image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials.},
doi = {10.1038/srep43585},
journal = {Scientific Reports},
number = ,
volume = 7,
place = {United States},
year = {2017},
month = {3}
}

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