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Title: Assessment of a new ZnO:Al contact to CdZnTe for X- and gamma-ray detector applications

Authors:
ORCiD logo [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2] ;  [1]
  1. Brookhaven National Laboratory, Upton, New York 11973, USA
  2. Department of Engineering, Norfolk State University, Norfolk, Virginia 23504, USA
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
AIP Advances
Additional Journal Information:
Journal Name: AIP Advances Journal Volume: 7 Journal Issue: 9; Journal ID: ISSN 2158-3226
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1394007