Pressurizing Field-Effect Transistors of Few-Layer MoS2 in a Diamond Anvil Cell
Abstract
Hydrostatic pressure applied using diamond anvil cells (DAC) has been widely explored to modulate physical properties of materials by tuning their lattice degree of freedom. Independently, electrical field is able to tune the electronic degree of freedom of functional materials via, for example, the field-effect transistor (FET) configuration. Combining these two orthogonal approaches would allow discovery of new physical properties and phases going beyond the known phase space. Such experiments are, however, technically challenging and have not been demonstrated. In this paper, we report a feasible strategy to prepare and measure FETs in a DAC by lithographically patterning the nanodevices onto the diamond culet. Multiple-terminal FETs were fabricated in the DAC using few-layer MoS2 and BN as the channel semiconductor and dielectric layer, respectively. It is found that the mobility, conductance, carrier concentration, and contact conductance of MoS2 can all be significantly enhanced with pressure. Finally, we expect that the approach could enable unprecedented ways to explore new phases and properties of materials under coupled mechano-electrostatic modulation.
- Authors:
-
- Univ. of California, Berkeley, CA (United States)
- Center for High Pressure Science and Technology Advanced Research, Shanghai (China)
- Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF); US Army Research Office (ARO)
- OSTI Identifier:
- 1393110
- Grant/Contract Number:
- AC02-05CH11231; DMR-1306601; CMMI-1434147; EAR 11- 57758; W911NF-14-1-0104
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Nano Letters
- Additional Journal Information:
- Journal Volume: 17; Journal Issue: 1; Journal ID: ISSN 1530-6984
- Publisher:
- American Chemical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; diamond anvil cell; field-effect transistor; h-BN dielectric; hydrostatic pressure; MoS2
Citation Formats
Chen, Yabin, Ke, Feng, Ci, Penghong, Ko, Changhyun, Park, Taegyun, Saremi, Sahar, Liu, Huili, Lee, Yeonbae, Suh, Joonki, Martin, Lane W., Ager, Joel W., Chen, Bin, and Wu, Junqiao. Pressurizing Field-Effect Transistors of Few-Layer MoS2 in a Diamond Anvil Cell. United States: N. p., 2016.
Web. doi:10.1021/acs.nanolett.6b03785.
Chen, Yabin, Ke, Feng, Ci, Penghong, Ko, Changhyun, Park, Taegyun, Saremi, Sahar, Liu, Huili, Lee, Yeonbae, Suh, Joonki, Martin, Lane W., Ager, Joel W., Chen, Bin, & Wu, Junqiao. Pressurizing Field-Effect Transistors of Few-Layer MoS2 in a Diamond Anvil Cell. United States. https://doi.org/10.1021/acs.nanolett.6b03785
Chen, Yabin, Ke, Feng, Ci, Penghong, Ko, Changhyun, Park, Taegyun, Saremi, Sahar, Liu, Huili, Lee, Yeonbae, Suh, Joonki, Martin, Lane W., Ager, Joel W., Chen, Bin, and Wu, Junqiao. Thu .
"Pressurizing Field-Effect Transistors of Few-Layer MoS2 in a Diamond Anvil Cell". United States. https://doi.org/10.1021/acs.nanolett.6b03785. https://www.osti.gov/servlets/purl/1393110.
@article{osti_1393110,
title = {Pressurizing Field-Effect Transistors of Few-Layer MoS2 in a Diamond Anvil Cell},
author = {Chen, Yabin and Ke, Feng and Ci, Penghong and Ko, Changhyun and Park, Taegyun and Saremi, Sahar and Liu, Huili and Lee, Yeonbae and Suh, Joonki and Martin, Lane W. and Ager, Joel W. and Chen, Bin and Wu, Junqiao},
abstractNote = {Hydrostatic pressure applied using diamond anvil cells (DAC) has been widely explored to modulate physical properties of materials by tuning their lattice degree of freedom. Independently, electrical field is able to tune the electronic degree of freedom of functional materials via, for example, the field-effect transistor (FET) configuration. Combining these two orthogonal approaches would allow discovery of new physical properties and phases going beyond the known phase space. Such experiments are, however, technically challenging and have not been demonstrated. In this paper, we report a feasible strategy to prepare and measure FETs in a DAC by lithographically patterning the nanodevices onto the diamond culet. Multiple-terminal FETs were fabricated in the DAC using few-layer MoS2 and BN as the channel semiconductor and dielectric layer, respectively. It is found that the mobility, conductance, carrier concentration, and contact conductance of MoS2 can all be significantly enhanced with pressure. Finally, we expect that the approach could enable unprecedented ways to explore new phases and properties of materials under coupled mechano-electrostatic modulation.},
doi = {10.1021/acs.nanolett.6b03785},
journal = {Nano Letters},
number = 1,
volume = 17,
place = {United States},
year = {Thu Dec 08 00:00:00 EST 2016},
month = {Thu Dec 08 00:00:00 EST 2016}
}
Web of Science
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