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Title: Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Authors:
; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1389084
Alternate Identifier(s):
OSTI ID: 1373122
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Published Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 176 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; aberration-corrected TEM; environmental TEM; electron energy loss spectroscopy; in situ high resolution electron microscopy; epitaxial ceria thin films; yttria-stabilized zirconia substrates

Citation Formats

Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, and Chueh, William C. Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy. Netherlands: N. p., 2017. Web. doi:10.1016/j.ultramic.2017.03.015.
Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, & Chueh, William C. Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy. Netherlands. doi:10.1016/j.ultramic.2017.03.015.
Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, and Chueh, William C. Mon . "Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy". Netherlands. doi:10.1016/j.ultramic.2017.03.015.
@article{osti_1389084,
title = {Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy},
author = {Sinclair, Robert and Lee, Sang Chul and Shi, Yezhou and Chueh, William C.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.03.015},
journal = {Ultramicroscopy},
number = C,
volume = 176,
place = {Netherlands},
year = {2017},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.03.015

Citation Metrics:
Cited by: 6 works
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