Direct imaging of isofrequency contours in photonic structures
Abstract
The isofrequency contours of a photonic crystal are important for predicting and understanding exotic optical phenomena that are not apparent from high-symmetry band structure visualizations. We demonstrate a method to directly visualize the isofrequency contours of high-quality photonic crystal slabs that show quantitatively good agreement with numerical results throughout the visible spectrum. Our technique relies on resonance-enhanced photon scattering from generic fabrication disorder and surface roughness, so it can be applied to general photonic and plasmonic crystals or even quasi-crystals. We also present an analytical model of the scattering process, which explains the observation of isofrequency contours in our technique. Furthermore, the isofrequency contours provide information about the characteristics of the disorder and therefore serve as a feedback tool to improve fabrication processes.
- Authors:
-
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Wellesley College, MA (United States)
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); NEC Corp., Ibaraki (Japan)
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Technion-Israel Inst. of Tech., Haifa (Israel)
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Yale Univ., New Haven, CT (United States)
- Publication Date:
- Research Org.:
- Energy Frontier Research Centers (EFRC) (United States). Solid-State Solar-Thermal Energy Conversion Center (S3TEC)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1388456
- Grant/Contract Number:
- SC0001299; FG02-09ER46577
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Science Advances
- Additional Journal Information:
- Journal Volume: 2; Journal Issue: 11; Related Information: S3TEC partners with Massachusetts Institute of Technology (lead); Boston College; Oak Ridge National Laboratory; Rensselaer Polytechnic Institute; Journal ID: ISSN 2375-2548
- Publisher:
- AAAS
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Regan, E. C., Igarashi, Y., Zhen, B., Kaminer, I., Hsu, C. W., Shen, Y., Joannopoulos, J. D., and Soljacic, M. Direct imaging of isofrequency contours in photonic structures. United States: N. p., 2016.
Web. doi:10.1126/sciadv.1601591.
Regan, E. C., Igarashi, Y., Zhen, B., Kaminer, I., Hsu, C. W., Shen, Y., Joannopoulos, J. D., & Soljacic, M. Direct imaging of isofrequency contours in photonic structures. United States. https://doi.org/10.1126/sciadv.1601591
Regan, E. C., Igarashi, Y., Zhen, B., Kaminer, I., Hsu, C. W., Shen, Y., Joannopoulos, J. D., and Soljacic, M. Fri .
"Direct imaging of isofrequency contours in photonic structures". United States. https://doi.org/10.1126/sciadv.1601591. https://www.osti.gov/servlets/purl/1388456.
@article{osti_1388456,
title = {Direct imaging of isofrequency contours in photonic structures},
author = {Regan, E. C. and Igarashi, Y. and Zhen, B. and Kaminer, I. and Hsu, C. W. and Shen, Y. and Joannopoulos, J. D. and Soljacic, M.},
abstractNote = {The isofrequency contours of a photonic crystal are important for predicting and understanding exotic optical phenomena that are not apparent from high-symmetry band structure visualizations. We demonstrate a method to directly visualize the isofrequency contours of high-quality photonic crystal slabs that show quantitatively good agreement with numerical results throughout the visible spectrum. Our technique relies on resonance-enhanced photon scattering from generic fabrication disorder and surface roughness, so it can be applied to general photonic and plasmonic crystals or even quasi-crystals. We also present an analytical model of the scattering process, which explains the observation of isofrequency contours in our technique. Furthermore, the isofrequency contours provide information about the characteristics of the disorder and therefore serve as a feedback tool to improve fabrication processes.},
doi = {10.1126/sciadv.1601591},
journal = {Science Advances},
number = 11,
volume = 2,
place = {United States},
year = {Fri Nov 25 00:00:00 EST 2016},
month = {Fri Nov 25 00:00:00 EST 2016}
}
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