Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
Abstract
Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. Here in this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with a Sobel filter before performing cross correlation or performing a square-root magnitude weighted phase correlation returned the best results when inner disk structure was present. Lastly, we have tested these methods both on simulated datasets, and experimental data from unstrained silicon as well as a twin grain boundary in 304 stainless steel.
- Authors:
-
- Univ. of California, Berkeley, CA (United States). Dept. of Materials Science and Engineering; Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy, Molecular Foundry
- Erich Schmid Inst. of Materials Science, Leoben (Austria)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy, Molecular Foundry
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); Austrian Science Fund (FWF)
- OSTI Identifier:
- 1379825
- Alternate Identifier(s):
- OSTI ID: 1416658
- Grant/Contract Number:
- AC02-05CH11231; AC02-05-CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Volume: 176; Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Nanobeam electron diffraction; Strain measurement
Citation Formats
Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Minor, Andrew M., and Ophus, Colin. Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping. United States: N. p., 2017.
Web. doi:10.1016/j.ultramic.2016.12.021.
Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Minor, Andrew M., & Ophus, Colin. Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping. United States. https://doi.org/10.1016/j.ultramic.2016.12.021
Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Minor, Andrew M., and Ophus, Colin. Sat .
"Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping". United States. https://doi.org/10.1016/j.ultramic.2016.12.021. https://www.osti.gov/servlets/purl/1379825.
@article{osti_1379825,
title = {Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping},
author = {Pekin, Thomas C. and Gammer, Christoph and Ciston, Jim and Minor, Andrew M. and Ophus, Colin},
abstractNote = {Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. Here in this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with a Sobel filter before performing cross correlation or performing a square-root magnitude weighted phase correlation returned the best results when inner disk structure was present. Lastly, we have tested these methods both on simulated datasets, and experimental data from unstrained silicon as well as a twin grain boundary in 304 stainless steel.},
doi = {10.1016/j.ultramic.2016.12.021},
journal = {Ultramicroscopy},
number = C,
volume = 176,
place = {United States},
year = {Sat Jan 28 00:00:00 EST 2017},
month = {Sat Jan 28 00:00:00 EST 2017}
}
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