Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy

Booth, Corwin H.; Medling, S. A.; Tobin, J. G.; Baumbach, Ryan E.; Bauer, Eric Dietzgen; Sokaras, D.; Nordlund, D.; Weng, T. -C.

doi:10.1103/PhysRevB.94.045121

Title: Probing $5 f$ -state configurations in ${URu}_{2} {Si}_{2}$ with U $L_{III}$ -edge resonant x-ray emission spectroscopy

Journal Article · Fri Jul 15 00:00:00 EDT 2016 · Physical Review B

DOI: https://doi.org/10.1103/PhysRevB.94.045121 · OSTI ID:1379516

Booth, Corwin H. ^[1]; Medling, S. A. ^[2]; Tobin, J. G. ^[3]; Baumbach, Ryan E. ^[4];

^[5]; Sokaras, D. ^[6]; Nordlund, D. ^[6]; Weng, T. -C. ^[7]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Australian National Univ., Canberra (Australia)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of Wisconsin-Oshkosh, WI (United States)
National High Magnetic Field Lab., Tallahassee, FL (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Center for High Pressure Science & Technology Advanced Research, Shanghai (People's Republic of China)

Resonant x-ray emission spectroscopy (RXES) was employed at the U LIII absorption edge and the L_α1 emission line to explore the 5f occupancy, nf, and the degree of 5f-orbital delocalization in the hidden-order compound URu₂Si₂. By comparing to suitable reference materials such as UF₄, UCd₁₁, and α-U, we conclude that the 5f orbital in URu₂Si₂ is at least partially delocalized with n_f=2.87±0.08, and does not change with temperature down to 10 K within the estimated error. These results place further constraints on theoretical explanations of the hidden order, especially those requiring a localized f² ground state.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC02-05CH11231; AC52-07NA27344; AC02-76SF00515

OSTI ID:: 1379516

Journal Information:: Physical Review B, Journal Name: Physical Review B Journal Issue: 4 Vol. 94; ISSN 2469-9950; ISSN PRBMDO

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Probing $5 f$ -state configurations in ${URu}_{2} {Si}_{2}$ with U $L_{III}$ -edge resonant x-ray emission spectroscopy