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Title: High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11

Abstract

© 2016 IOP Publishing Ltd. We report a study of high pressure x-ray absorption (XAS) performed in the partial fluorescence yield mode (PFY) at the U L 3 edge (0-28.2 GPa) and single crystal x-ray diffraction (SXD) (0-20 GPa) on the UCd 11 heavy fermion compound at room temperature. Under compression, the PFY-XAS results show that the white line is shifted by +4.1(3) eV at the highest applied pressure of 28.2 GPa indicating delocalization of the 5f electrons. The increase in full width at half maxima and decrease in relative amplitude of the white line with respect to the edge jump point towards 6d band broadening under high pressure. A bulk modulus of K 0 = 62(1) GPa and its pressure derivative, = 4.9(2) was determined from high pressure SXD results. Both the PFY-XAS and diffraction results do not show any sign of a structural phase transition in the applied pressure range.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1379093
Alternate Identifier(s):
OSTI ID: 1407874
Report Number(s):
LA-UR-16-24577
Journal ID: ISSN 0953-8984; ark:/13030/qt3kq0s4d1
Grant/Contract Number:  
AC02-05CH11231; AC52-06NA25396
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Physics. Condensed Matter
Additional Journal Information:
Journal Volume: 28; Journal Issue: 10; Journal ID: ISSN 0953-8984
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English

Citation Formats

Nasreen, Farzana, Antonio, Daniel, VanGennep, Derrick, Booth, Corwin H., Kothapalli, Karunakar, Bauer, Eric D., Sarrao, John L., Lavina, Barbara, Iota-Herbei, Valentin, Sinogeikin, Stanislav, Chow, Paul, Xiao, Yuming, Zhao, Yusheng, and Cornelius, Andrew L. High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11. United States: N. p., 2016. Web. doi:10.1088/0953-8984/28/10/105601.
Nasreen, Farzana, Antonio, Daniel, VanGennep, Derrick, Booth, Corwin H., Kothapalli, Karunakar, Bauer, Eric D., Sarrao, John L., Lavina, Barbara, Iota-Herbei, Valentin, Sinogeikin, Stanislav, Chow, Paul, Xiao, Yuming, Zhao, Yusheng, & Cornelius, Andrew L. High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11. United States. doi:10.1088/0953-8984/28/10/105601.
Nasreen, Farzana, Antonio, Daniel, VanGennep, Derrick, Booth, Corwin H., Kothapalli, Karunakar, Bauer, Eric D., Sarrao, John L., Lavina, Barbara, Iota-Herbei, Valentin, Sinogeikin, Stanislav, Chow, Paul, Xiao, Yuming, Zhao, Yusheng, and Cornelius, Andrew L. Mon . "High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11". United States. doi:10.1088/0953-8984/28/10/105601. https://www.osti.gov/servlets/purl/1379093.
@article{osti_1379093,
title = {High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11},
author = {Nasreen, Farzana and Antonio, Daniel and VanGennep, Derrick and Booth, Corwin H. and Kothapalli, Karunakar and Bauer, Eric D. and Sarrao, John L. and Lavina, Barbara and Iota-Herbei, Valentin and Sinogeikin, Stanislav and Chow, Paul and Xiao, Yuming and Zhao, Yusheng and Cornelius, Andrew L.},
abstractNote = {© 2016 IOP Publishing Ltd. We report a study of high pressure x-ray absorption (XAS) performed in the partial fluorescence yield mode (PFY) at the U L 3 edge (0-28.2 GPa) and single crystal x-ray diffraction (SXD) (0-20 GPa) on the UCd 11 heavy fermion compound at room temperature. Under compression, the PFY-XAS results show that the white line is shifted by +4.1(3) eV at the highest applied pressure of 28.2 GPa indicating delocalization of the 5f electrons. The increase in full width at half maxima and decrease in relative amplitude of the white line with respect to the edge jump point towards 6d band broadening under high pressure. A bulk modulus of K 0 = 62(1) GPa and its pressure derivative, = 4.9(2) was determined from high pressure SXD results. Both the PFY-XAS and diffraction results do not show any sign of a structural phase transition in the applied pressure range.},
doi = {10.1088/0953-8984/28/10/105601},
journal = {Journal of Physics. Condensed Matter},
number = 10,
volume = 28,
place = {United States},
year = {2016},
month = {2}
}

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