Pump–probe spectrometer for measuring x-ray induced strain

Journal Article · Wed Apr 20 00:00:00 EDT 2016 · Optics Letters

DOI: https://doi.org/10.1364/OL.41.001977 · OSTI ID:1376705

Loether, A. ^[1]; Adams, B. W. ^[2]; DiCharia, A. ^[2]; Gao, Y. ^[2]; Henning, R. ^[3]; Walko, D. A. ^[2]; DeCamp, M. F. ^[1]

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1. Univ. of Delaware, Newark, DE (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States)
3. The Univ. of Chicago, Argonne, IL (United States)

A hard x-ray pump–probe spectrometer using a multi-crystal Bragg reflector is demonstrated at a third generation synchrotron source. This device derives both broadband pump and monochromatic probe pulses directly from a single intense, broadband x-ray pulse centered at 8.767 keV. In conclusion, we present a proof-of-concept experiment which directly measures x-ray induced crystalline lattice strain.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
• Grant/Contract Number: AC02-06CH11357
• OSTI ID: 1376705
• Journal Information: Optics Letters, Journal Name: Optics Letters Journal Issue: 9 Vol. 41; ISSN OPLEDP; ISSN 0146-9592
• Publisher: Optical Society of America (OSA)Copyright Statement
• Country of Publication: United States
• Language: English