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Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.
Authors:
 [1] ;  [2] ;  [2] ;  [2] ;  [3] ;  [4]
  1. Western Michigan Univ., Kalamazoo MI (United States); Chinese Academy of Sciences (CAS), Chongqing (China)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Western Michigan Univ., Kalamazoo MI (United States); South Univ. of Science and Technology of China, Shenzhen (China)
  4. Western Michigan Univ., Kalamazoo MI (United States)
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 8; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
OSTI Identifier:
1362111

Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States: N. p., Web. doi:10.1063/1.4959566.
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, & Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States. doi:10.1063/1.4959566.
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. 2016. "Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering". United States. doi:10.1063/1.4959566. https://www.osti.gov/servlets/purl/1362111.
@article{osti_1362111,
title = {Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering},
author = {Gao, Xuan and Casa, Diego and Kim, Jungho and Gog, Thomas and Li, Chengyang and Burns, Clement},
abstractNote = {Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.},
doi = {10.1063/1.4959566},
journal = {Review of Scientific Instruments},
number = 8,
volume = 87,
place = {United States},
year = {2016},
month = {8}
}