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Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Journal Article · · Review of Scientific Instruments
DOI: https://doi.org/10.1063/1.4959566 · OSTI ID:1362111
 [1];  [2];  [2];  [2];  [3];  [4]
  1. Western Michigan Univ., Kalamazoo MI (United States); Chinese Academy of Sciences (CAS), Chongqing (China)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Western Michigan Univ., Kalamazoo MI (United States); South Univ. of Science and Technology of China, Shenzhen (China)
  4. Western Michigan Univ., Kalamazoo MI (United States)
+ Show Author Affiliations

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1362111
Journal Information:
Review of Scientific Instruments, Vol. 87, Issue 8; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

References (28)

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Cited By (1)

Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution preprint January 2017

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