Search Menu
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information
Search Scholarly Publications

Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Abstract

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

Authors:
 [1];  [2];  [2];  [2];  [3];  [4]
+ Show Author Affiliations
  1. Western Michigan Univ., Kalamazoo MI (United States); Chinese Academy of Sciences (CAS), Chongqing (China)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Western Michigan Univ., Kalamazoo MI (United States); South Univ. of Science and Technology of China, Shenzhen (China)
  4. Western Michigan Univ., Kalamazoo MI (United States)
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
OSTI Identifier:
1362111
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 8; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States: N. p., 2016. Web. doi:10.1063/1.4959566.
Copy to clipboard
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, & Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States. https://doi.org/10.1063/1.4959566
Copy to clipboard
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. Mon . "Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering". United States. https://doi.org/10.1063/1.4959566. https://www.osti.gov/servlets/purl/1362111.
Copy to clipboard
@article{osti_1362111,
title = {Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering},
author = {Gao, Xuan and Casa, Diego and Kim, Jungho and Gog, Thomas and Li, Chengyang and Burns, Clement},
abstractNote = {Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.},
doi = {10.1063/1.4959566},
journal = {Review of Scientific Instruments},
number = 8,
volume = 87,
place = {United States},
year = {2016},
month = {8}
}
Copy to clipboard
Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4959566
Copyright Statement
Other availability
Search WorldCat Search WorldCat to find libraries that may hold this journal
Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science
Save / Share:
Export Metadata
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.

Works referenced in this record:

Observation of a 500 meV Collective Mode in La 2 − x Sr x CuO 4 and Nd 2 CuO 4 Using Resonant Inelastic X-Ray Scattering
journal, March 2008

Prototype grooved and spherically bent Si backscattering crystal analyzer for meV resolution inelastic x‐ray scattering
journal, February 1995

  • Blasdell, R. C.; Macrander, A. T.
  • Review of Scientific Instruments, Vol. 66, Issue 2
  • DOI: 10.1063/1.1145732

Low Energy Electronic Excitations in the Layered Cuprates Studied by Copper L 3 Resonant Inelastic X-Ray Scattering
journal, March 2004

Computer simulation of bent perfect crystal diffraction profiles
conference, December 1997

  • Sanchez del Rio, Manuel; Ferrero, Claudio; Mocella, V.
  • Optical Science, Engineering and Instrumentation '97, SPIE Proceedings
  • DOI: 10.1117/12.294490

A Dynamical Theory of Diffraction for a Distorted Crystal
journal, May 1969

  • Takagi, Satio
  • Journal of the Physical Society of Japan, Vol. 26, Issue 5
  • DOI: 10.1143/JPSJ.26.1239

Status of XOP: an x-ray optics software toolkit
conference, October 2004

  • Sanchez del Rio, Manuel; Dejus, Roger J.
  • Optical Science and Technology, the SPIE 49th Annual Meeting, SPIE Proceedings
  • DOI: 10.1117/12.560903

Study of dynamically bent crystals for X-ray focusing optics
journal, October 1991

  • Krisch, M.; Freund, A.; Marot, G.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 308, Issue 1-2
  • DOI: 10.1016/0168-9002(91)90674-F

Theory of Resonant Inelastic X-Ray Scattering by Collective Magnetic Excitations
journal, October 2010

Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine
journal, January 2003

  • Sinars, Daniel B.; Bennett, Guy R.; Wenger, David F.
  • Applied Optics, Vol. 42, Issue 19
  • DOI: 10.1364/AO.42.004059

Ray tracing simulation of 1-BM beamline at the Advanced Photon Source for polarization analyses of synchrotron optics
conference, September 2014

Advances in crystal analyzers for inelastic X-ray scattering
journal, December 2005

  • Verbeni, R.; Kocsis, M.; Huotari, S.
  • Journal of Physics and Chemistry of Solids, Vol. 66, Issue 12
  • DOI: 10.1016/j.jpcs.2005.09.079

Resonant inelastic hard x-ray scattering with diced analyzer crystals and position-sensitive detectors
journal, May 2006

  • Huotari, S.; Albergamo, F.; Vankó, Gy.
  • Review of Scientific Instruments, Vol. 77, Issue 5
  • DOI: 10.1063/1.2198805

Resonant inelastic x-ray scattering spectra for electrons in solids
journal, February 2001

Bragg transmission phase plates for the production of circularly polarized x rays
journal, February 1995

  • Lang, J. C.; Srajer, George
  • Review of Scientific Instruments, Vol. 66, Issue 2
  • DOI: 10.1063/1.1145902

An X-ray spectrometer for inelastic scattering experiments. I. Curved-crystal X-ray optics
journal, October 1986

Magnetic Excitations and Phase Separation in the Underdoped La 2 − x Sr x CuO 4 Superconductor Measured by Resonant Inelastic X-Ray Scattering
journal, February 2010

Low-energy d - d excitations in MnO studied by resonant x-ray fluorescence spectroscopy
journal, August 1996

Theoretical reflectivities of bent crystal analyzers for fusion plasma diagnostics
journal, November 1990

  • Caciuffo, R.; Ferrero, C.; Francescangeli, O.
  • Review of Scientific Instruments, Vol. 61, Issue 11
  • DOI: 10.1063/1.1141605

Momentum-resolved electronic excitations in the Mott insulator Sr 2 IrO 4 studied by resonant inelastic x-ray scattering
journal, March 2011

X‐Ray Diffraction by Elastically Deformed Crystals
journal, September 1950

Development of a graphite polarization analyzer for resonant inelastic x-ray scattering
journal, November 2011

  • Gao, Xuan; Burns, Clement; Casa, Diego
  • Review of Scientific Instruments, Vol. 82, Issue 11
  • DOI: 10.1063/1.3662472

Momentum-resolved Resonant and Nonresonant Inelastic X-ray Scattering at the Advanced Photon Source
journal, November 2009

Polarization-analyzed resonant inelastic x-ray scattering of the orbital excitations in KCuF 3
journal, June 2011

Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011

  • Ament, Luuk J. P.; van Veenendaal, Michel; Devereaux, Thomas P.
  • Reviews of Modern Physics, Vol. 83, Issue 2
  • DOI: 10.1103/RevModPhys.83.705

Inelastic x-ray scattering by electronic excitations under high pressure
journal, March 2010

Inelastic light scattering from correlated electrons
journal, January 2007

Incident energy and polarization-dependent resonant inelastic x-ray scattering study of La 2 Cu O 4
journal, December 2006

    Sort by:
    [ × clear filter / sort ]

    Works referencing / citing this record:

      Sort by:
      [ × clear filter / sort ]

      Similar Records in DOE PAGES and OSTI.GOV collections: