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Title: Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films

Authors:
; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Advanced Research Projects Agency - Energy (ARPA-E)
OSTI Identifier:
1359887
Grant/Contract Number:  
AR0000064
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Solid State Ionics
Additional Journal Information:
Journal Name: Solid State Ionics Journal Volume: 287 Journal Issue: C; Journal ID: ISSN 0167-2738
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Mani, Prabhu Doss, Saraf, Shashank, Singh, Virendra, Real-Robert, Maria, Vijayakumar, Arun, Duranceau, Steven J., Seal, Sudipta, and Coffey, Kevin R. Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films. Netherlands: N. p., 2016. Web. doi:10.1016/j.ssi.2016.01.046.
Mani, Prabhu Doss, Saraf, Shashank, Singh, Virendra, Real-Robert, Maria, Vijayakumar, Arun, Duranceau, Steven J., Seal, Sudipta, & Coffey, Kevin R. Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films. Netherlands. https://doi.org/10.1016/j.ssi.2016.01.046
Mani, Prabhu Doss, Saraf, Shashank, Singh, Virendra, Real-Robert, Maria, Vijayakumar, Arun, Duranceau, Steven J., Seal, Sudipta, and Coffey, Kevin R. Fri . "Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films". Netherlands. https://doi.org/10.1016/j.ssi.2016.01.046.
@article{osti_1359887,
title = {Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films},
author = {Mani, Prabhu Doss and Saraf, Shashank and Singh, Virendra and Real-Robert, Maria and Vijayakumar, Arun and Duranceau, Steven J. and Seal, Sudipta and Coffey, Kevin R.},
abstractNote = {},
doi = {10.1016/j.ssi.2016.01.046},
journal = {Solid State Ionics},
number = C,
volume = 287,
place = {Netherlands},
year = {Fri Apr 01 00:00:00 EDT 2016},
month = {Fri Apr 01 00:00:00 EDT 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.ssi.2016.01.046

Citation Metrics:
Cited by: 23 works
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