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Title: Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

Steady state Raman has been widely used for temperature probing and thermal conductivity/conductance measurement in combination with temperature coefficient calibration. In this work, a new transient Raman thermal probing technique: frequency-resolved Raman (FR-Raman) is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are measured experimentally and reconstructed theoretically. They are used for fitting to determine the thermal diffusivity of the material under test. A Si cantilever is used to investigate the capacity of this new technique. The cantilever’s thermal diffusivity is determined as 9.57 × 10 -5 m 2/s, 11.00 × 10 -5 m 2/s and 9.02 × 10 -5 m 2/s by fitting the Raman intensity, wavenumber and emission. The deviation from the reference value is largely attributed to thermal stress-induced material deflection and Raman drift, which could be significantly suppressed by using a higher sensitivity Raman spectrometer with lower laser energy. As a result, the FR-Raman provides a novel way for transient thermal characterization of materials with a ?m spatial resolution.
 [1] ;  [1] ;  [2] ;  [3] ;  [1]
  1. Iowa State Univ., Ames, IA (United States)
  2. Idaho National Lab. (INL), Idaho Falls, ID (United States)
  3. Wuhan Univ., Hubei (China)
Publication Date:
Report Number(s):
Journal ID: ISSN 0146-9592; OPLEDP
Grant/Contract Number:
AC07-05ID14517; 0000671
Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 41; Journal Issue: 1; Journal ID: ISSN 0146-9592
Optical Society of America (OSA)
Research Org:
Idaho National Lab., Idaho Falls, ID (United States)
Sponsoring Org:
USDOE Office of Nuclear Energy (NE)
Country of Publication:
United States
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; frequency domain; Raman; thermal conductivity; thermography; thermal effects; scattering; temperature; metrology
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1234060