Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

Wang, Tianyu; Xu, Shen; Hurley, David H.; Yue, Yanan; Wang, Xinwei

doi:10.1364/OL.41.000080

Title: Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

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Abstract

Steady state Raman has been widely used for temperature probing and thermal conductivity/conductance measurement in combination with temperature coefficient calibration. In this work, a new transient Raman thermal probing technique: frequency-resolved Raman (FR-Raman) is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are measured experimentally and reconstructed theoretically. They are used for fitting to determine the thermal diffusivity of the material under test. A Si cantilever is used to investigate the capacity of this new technique. The cantilever’s thermal diffusivity is determined as 9.57 × 10^-5 m²/s, 11.00 × 10^-5 m²/s and 9.02 × 10^-5 m²/s by fitting the Raman intensity, wavenumber and emission. The deviation from the reference value is largely attributed to thermal stress-induced material deflection and Raman drift, which could be significantly suppressed by using a higher sensitivity Raman spectrometer with lower laser energy. As a result, the FR-Raman provides a novel way for transient thermal characterization of materials with a ?m spatial resolution.

Authors:

Wang, Tianyu ^[1]; Xu, Shen ^[1]; Hurley, David H. ^[2]; Yue, Yanan ^[3]; Wang, Xinwei ^[1]

Iowa State Univ., Ames, IA (United States)
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Wuhan Univ., Hubei (China)

Publication Date:: 2015-12-18

Research Org.:: Idaho National Lab. (INL), Idaho Falls, ID (United States)

Sponsoring Org.:: USDOE Office of Nuclear Energy (NE)

OSTI Identifier:: 1357249

Alternate Identifier(s):: OSTI ID: 1234060

Report Number(s):: INL/JOU-15-35835
Journal ID: ISSN 0146-9592; OPLEDP

Grant/Contract Number:: AC07-05ID14517; 0000671

Resource Type:: Accepted Manuscript

Journal Name:: Optics Letters

Additional Journal Information:: Journal Volume: 41; Journal Issue: 1; Journal ID: ISSN 0146-9592

Publisher:: Optical Society of America (OSA)

Country of Publication:: United States

Language:: English

Subject:: 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; frequency domain; Raman; thermal conductivity; thermography; thermal effects; scattering; temperature; metrology

Citation Formats


                    Wang, Tianyu, Xu, Shen, Hurley, David H., Yue, Yanan, and Wang, Xinwei. Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement.  United States: N. p., 2015. 
Web.  doi:10.1364/OL.41.000080.

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                    Wang, Tianyu, Xu, Shen, Hurley, David H., Yue, Yanan, & Wang, Xinwei. Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement.  United States.  https://doi.org/10.1364/OL.41.000080

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                    Wang, Tianyu, Xu, Shen, Hurley, David H., Yue, Yanan, and Wang, Xinwei. Fri .  
"Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement".  United States.  https://doi.org/10.1364/OL.41.000080.  https://www.osti.gov/servlets/purl/1357249.

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@article{osti_1357249,

  title        = {Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement},

  author       = {Wang, Tianyu and Xu, Shen and Hurley, David H. and Yue, Yanan and Wang, Xinwei},

  abstractNote = {Steady state Raman has been widely used for temperature probing and thermal conductivity/conductance measurement in combination with temperature coefficient calibration. In this work, a new transient Raman thermal probing technique: frequency-resolved Raman (FR-Raman) is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are measured experimentally and reconstructed theoretically. They are used for fitting to determine the thermal diffusivity of the material under test. A Si cantilever is used to investigate the capacity of this new technique. The cantilever’s thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s and 9.02 × 10-5 m2/s by fitting the Raman intensity, wavenumber and emission. The deviation from the reference value is largely attributed to thermal stress-induced material deflection and Raman drift, which could be significantly suppressed by using a higher sensitivity Raman spectrometer with lower laser energy. As a result, the FR-Raman provides a novel way for transient thermal characterization of materials with a ?m spatial resolution.},

  doi          = {10.1364/OL.41.000080},

  journal      = {Optics Letters},

  number       = 1,

  volume       = 41,

  place        = {United States},

  year         = {2015},

  month        = {12}

}

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