Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens [Fast Atomic-Scale Chemical Imaging of Crystalline Materials by STEM Energy-Dispersive X-ray Spectroscopy Achieved with Thin Specimens].
Abstract
Abstract Elemental mapping at the atomic-scale by scanning transmission electron microscopy (STEM) using energy-dispersive X-ray spectroscopy (EDS) provides a powerful real-space approach to chemical characterization of crystal structures. However, applications of this powerful technique have been limited by inefficient X-ray emission and collection, which require long acquisition times. Recently, using a lattice-vector translation method, we have shown that rapid atomic-scale elemental mapping using STEM-EDS can be achieved. This method provides atomic-scale elemental maps averaged over crystal areas of ~few 10 nm2with the acquisition time of ~2 s or less. Here we report the details of this method, and, in particular, investigate the experimental conditions necessary for achieving it. It shows, that in addition to usual conditions required for atomic-scale imaging, a thin specimen is essential for the technique to be successful. Phenomenological modeling shows that the localization of X-ray signals to atomic columns is a key reason. The effect of specimen thickness on the signal delocalization is studied by multislice image simulations. The results show that the X-ray localization can be achieved by choosing a thin specimen, and the thickness of less than about 22 nm is preferred for SrTiO3in [001] projection for 200 keV electrons.
- Authors:
-
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Univ. of Illinois, Urbana-Champaign, IL (United States)
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1356226
- Report Number(s):
- SAND-2016-10599J
Journal ID: ISSN 1431-9276; applab; PII: S1431927617000113
- Grant/Contract Number:
- AC04-94AL85000
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Microscopy and Microanalysis
- Additional Journal Information:
- Journal Volume: 23; Journal Issue: 01; Journal ID: ISSN 1431-9276
- Publisher:
- Microscopy Society of America (MSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Lu, Ping, Yuan, Renliang, and Zuo, Jian Min. Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens [Fast Atomic-Scale Chemical Imaging of Crystalline Materials by STEM Energy-Dispersive X-ray Spectroscopy Achieved with Thin Specimens].. United States: N. p., 2017.
Web. doi:10.1017/S1431927617000113.
Lu, Ping, Yuan, Renliang, & Zuo, Jian Min. Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens [Fast Atomic-Scale Chemical Imaging of Crystalline Materials by STEM Energy-Dispersive X-ray Spectroscopy Achieved with Thin Specimens].. United States. https://doi.org/10.1017/S1431927617000113
Lu, Ping, Yuan, Renliang, and Zuo, Jian Min. Thu .
"Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens [Fast Atomic-Scale Chemical Imaging of Crystalline Materials by STEM Energy-Dispersive X-ray Spectroscopy Achieved with Thin Specimens].". United States. https://doi.org/10.1017/S1431927617000113. https://www.osti.gov/servlets/purl/1356226.
@article{osti_1356226,
title = {Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens [Fast Atomic-Scale Chemical Imaging of Crystalline Materials by STEM Energy-Dispersive X-ray Spectroscopy Achieved with Thin Specimens].},
author = {Lu, Ping and Yuan, Renliang and Zuo, Jian Min},
abstractNote = {Abstract Elemental mapping at the atomic-scale by scanning transmission electron microscopy (STEM) using energy-dispersive X-ray spectroscopy (EDS) provides a powerful real-space approach to chemical characterization of crystal structures. However, applications of this powerful technique have been limited by inefficient X-ray emission and collection, which require long acquisition times. Recently, using a lattice-vector translation method, we have shown that rapid atomic-scale elemental mapping using STEM-EDS can be achieved. This method provides atomic-scale elemental maps averaged over crystal areas of ~few 10 nm2with the acquisition time of ~2 s or less. Here we report the details of this method, and, in particular, investigate the experimental conditions necessary for achieving it. It shows, that in addition to usual conditions required for atomic-scale imaging, a thin specimen is essential for the technique to be successful. Phenomenological modeling shows that the localization of X-ray signals to atomic columns is a key reason. The effect of specimen thickness on the signal delocalization is studied by multislice image simulations. The results show that the X-ray localization can be achieved by choosing a thin specimen, and the thickness of less than about 22 nm is preferred for SrTiO3in [001] projection for 200 keV electrons.},
doi = {10.1017/S1431927617000113},
journal = {Microscopy and Microanalysis},
number = 01,
volume = 23,
place = {United States},
year = {2017},
month = {2}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 1 work
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Atomic-resolution chemical analysis using a scanning transmission electron microscope
journal, November 1993
- Browning, N. D.; Chisholm, M. F.; Pennycook, S. J.
- Nature, Vol. 366, Issue 6451
Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy
journal, January 2012
- Allen, Leslie J.; D’Alfonso, Adrian J.; Freitag, Bert
- MRS Bulletin, Vol. 37, Issue 1
Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy
journal, April 2013
- Lu, Ping; Xiong, Jie; Van Benthem, Mark
- Applied Physics Letters, Vol. 102, Issue 17
Two-Dimensional Mapping of Chemical Information at Atomic Resolution
journal, August 2007
- Bosman, M.; Keast, V. J.; García-Muñoz, J. L.
- Physical Review Letters, Vol. 99, Issue 8
Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and image processing
journal, April 2002
- Kirkland, A. I.; Saxton, W. O.
- Journal of Microscopy, Vol. 206, Issue 1
Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy
journal, March 2010
- D’Alfonso, A. J.; Freitag, B.; Klenov, D.
- Physical Review B, Vol. 81, Issue 10
Interpreting atomic-resolution spectroscopic images
journal, August 2007
- Oxley, M. P.; Varela, M.; Pennycook, T. J.
- Physical Review B, Vol. 76, Issue 6
Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy
journal, September 2016
- Chen, Z.; Weyland, M.; Sang, X.
- Ultramicroscopy, Vol. 168
Fast Atomic-Scale Chemical Imaging of Crystalline Materials and Dynamic Phase Transformations
journal, March 2016
- Lu, Ping; Yuan, Ren Liang; Ihlefeld, Jon F.
- Nano Letters, Vol. 16, Issue 4
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
journal, February 2008
- Muller, D. A.; Kourkoutis, L. F.; Murfitt, M.
- Science, Vol. 319, Issue 5866
The correlation averaging of a regularly arranged bacterial cell envelope protein
journal, August 1982
- Saxton, W. O.; Baumeister, W.
- Journal of Microscopy, Vol. 127, Issue 2
Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron Microscopy
journal, September 2003
- Allen, L. J.; Findlay, S. D.; Lupini, A. R.
- Physical Review Letters, Vol. 91, Issue 10
Element-selective imaging of atomic columns in a crystal using STEM and EELS
journal, October 2007
- Kimoto, Koji; Asaka, Toru; Nagai, Takuro
- Nature, Vol. 450, Issue 7170
Contribution of thermally scattered electrons to atomic resolution elemental maps
journal, July 2012
- Forbes, B. D.; D'Alfonso, A. J.; Williams, R. E. A.
- Physical Review B, Vol. 86, Issue 2
Emergent Chemical Mapping at Atomic-Column Resolution by Energy-Dispersive X-Ray Spectroscopy in an Aberration-Corrected Electron Microscope
journal, May 2010
- Chu, M. -W.; Liou, S. C.; Chang, C. -P.
- Physical Review Letters, Vol. 104, Issue 19