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Title: Impact of gate geometry on ionic liquid gated ionotronic systems

Journal Article · · APL Materials
DOI: https://doi.org/10.1063/1.4974485 · OSTI ID:1340475
 [1];  [2];  [2]; ORCiD logo [2];  [3];  [4];  [4]; ORCiD logo [5]; ORCiD logo [6];  [1];  [2];  [4]
  1. Univ. of Tennessee, Knoxville, TN (United States). Materials Science and Engineering Dept.; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
  2. Univ. of Tennessee, Knoxville, TN (United States). Materials Science and Engineering Dept.; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science
  4. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
  5. Univ. of Tennessee, Knoxville, TN (United States). Materials Science and Engineering Dept.
  6. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Chemical Science Division

Ionic liquid electrolytes are gaining widespread application as a gate dielectric used to control ion transport in functional materials. This letter systematically examines the important influence that device geometry in standard “side gate” 3-terminal geometries plays in device performance of a well-known oxygen ion conductor. We show that the most influential component of device design is the ratio between the area of the gate electrode and the active channel, while the spacing between these components and their individual shapes has a negligible contribution. Finally, these findings provide much needed guidance in device design intended for ionotronic gating with ionic liquids.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Laboratory Directed Research and Development (LDRD) Program; National Science Foundation (NSF) (United States); Univ. of Tennessee (United States). Joint Directed Research and Development (JDRD) Program; Gordon and Betty Moore Foundation (United States)
Grant/Contract Number:
AC05-00OR22725; SC0002136
OSTI ID:
1340475
Journal Information:
APL Materials, Journal Name: APL Materials Journal Issue: 4 Vol. 5; ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (26)

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Electrolyte-Gated Transistors for Organic and Printed Electronics journal December 2012
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High-Throughput Synthesis of Graphene by Intercalation−Exfoliation of Graphite Oxide and Study of Ionic Screening in Graphene Transistor journal September 2009
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Electronics and optoelectronics of two-dimensional transition metal dichalcogenides journal November 2012
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Quantitative Calculation of Oxygen Incorporation in Sputtered IGZO Films and the Impact on Transistor Properties journal January 2011
Ionic Liquid versus SiO 2 Gated a-IGZO Thin Film Transistors: A Direct Comparison journal January 2015

Cited By (4)

Programmable Electrofluidics for Ionic Liquid Based Neuromorphic Platform journal July 2019
Ionic Gating of Ultrathin and Leaky Ferroelectrics journal January 2019
Realization and AC modeling of electronic circuits with water-gated field effect transistors (WG-FETs) based on gate probe distance journal October 2018
Programmable Electrofluidics for Ionic Liquid Based Neuromorphic Platform journal July 2019

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