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Title: Recent applications of hard x-ray photoelectron spectroscopy

Abstract

Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in-situ or in-operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. We also present physical considerations that differentiate HAXPES from photoemission measurements utilizing soft and ultraviolet x rays.

Authors:
 [1];  [2];  [3];  [1]
  1. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1340393
Report Number(s):
BNL-112623-2016-JA
Journal ID: ISSN 0734-2101
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
Additional Journal Information:
Journal Volume: 34; Journal Issue: 3; Journal ID: ISSN 0734-2101
Publisher:
American Vacuum Society
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE

Citation Formats

Weiland, Conan, Rumaiz, Abdul K., Pianetta, Piero, and Woicik, Joseph C. Recent applications of hard x-ray photoelectron spectroscopy. United States: N. p., 2016. Web. doi:10.1116/1.4946046.
Weiland, Conan, Rumaiz, Abdul K., Pianetta, Piero, & Woicik, Joseph C. Recent applications of hard x-ray photoelectron spectroscopy. United States. doi:10.1116/1.4946046.
Weiland, Conan, Rumaiz, Abdul K., Pianetta, Piero, and Woicik, Joseph C. Thu . "Recent applications of hard x-ray photoelectron spectroscopy". United States. doi:10.1116/1.4946046. https://www.osti.gov/servlets/purl/1340393.
@article{osti_1340393,
title = {Recent applications of hard x-ray photoelectron spectroscopy},
author = {Weiland, Conan and Rumaiz, Abdul K. and Pianetta, Piero and Woicik, Joseph C.},
abstractNote = {Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in-situ or in-operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. We also present physical considerations that differentiate HAXPES from photoemission measurements utilizing soft and ultraviolet x rays.},
doi = {10.1116/1.4946046},
journal = {Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films},
number = 3,
volume = 34,
place = {United States},
year = {2016},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 3 works
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