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Title: Recent applications of hard x-ray photoelectron spectroscopy

Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in-situ or in-operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. We also present physical considerations that differentiate HAXPES from photoemission measurements utilizing soft and ultraviolet x rays.
Authors:
 [1] ;  [2] ;  [3] ;  [1]
  1. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Report Number(s):
BNL-112623-2016-JA
Journal ID: ISSN 0734-2101
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
Additional Journal Information:
Journal Volume: 34; Journal Issue: 3; Journal ID: ISSN 0734-2101
Publisher:
American Vacuum Society
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE
OSTI Identifier:
1340393