Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements

Sinsheimer, John; Bouet, Nathalie; Ghose, Sanjit; Dooryhee, Eric; Conley, Ray

doi:10.1107/S1600577516013084

Title: Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements

Abstract

A new system of slits called `spiderweb slits' have been developed for depth-resolved powder or polycrystalline X-ray diffraction measurements. The slits act on diffracted X-rays to select a particular gauge volume of sample, while absorbing diffracted X-rays from outside of this volume. Although the slit geometry is to some extent similar to that of previously developed conical slits or spiral slits, this new design has advantages over the previous ones in use for complex heterogeneous materials and in situ and operando diffraction measurements. For example, the slits can measure a majority of any diffraction cone for any polycrystalline material, over a continuous range of diffraction angles, and work for X-ray energies of tens to hundreds of kiloelectronvolts. In addition, the design is generated and optimized using ray-tracing simulations, and fabricated through laser micromachining. The first prototype was successfully tested at the X17A beamline at the National Synchrotron Light Source, and shows similar performance to simulations, demonstrating gauge volume selection for standard powders, for all diffraction peaks over angles of 2–10°. A similar, but improved, design will be implemented at the X-ray Powder Diffraction beamline at the National Synchrotron Light Source II.

Authors:

Sinsheimer, John ^[1]; Bouet, Nathalie ^[1]; Ghose, Sanjit ^[1]; Dooryhee, Eric ^[1]; Conley, Ray ^[2]

Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchroton Light Source II
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchroton Light Source II; Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Publication Date:: Thu Oct 06 00:00:00 EDT 2016

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1340368

Report Number(s):: BNL-112332-2016-JA
Journal ID: ISSN 1600-5775; TRN: US1701567

Grant/Contract Number:: SC00112704; AC02-98CH10886

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Synchrotron Radiation (Online)

Additional Journal Information:: Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 23; Journal Issue: 6; Journal ID: ISSN 1600-5775

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; synchrotron X-ray powder diffraction; depth-resolved; slits; ray-tracing

Citation Formats


                    Sinsheimer, John, Bouet, Nathalie, Ghose, Sanjit, Dooryhee, Eric, and Conley, Ray. Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements.  United States: N. p., 2016. 
Web.  doi:10.1107/S1600577516013084.

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                    Sinsheimer, John, Bouet, Nathalie, Ghose, Sanjit, Dooryhee, Eric, & Conley, Ray. Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements.  United States.  https://doi.org/10.1107/S1600577516013084

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                    Sinsheimer, John, Bouet, Nathalie, Ghose, Sanjit, Dooryhee, Eric, and Conley, Ray. Thu .  
"Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements".  United States.  https://doi.org/10.1107/S1600577516013084.  https://www.osti.gov/servlets/purl/1340368.

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@article{osti_1340368,

  title        = {Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements},

  author       = {Sinsheimer, John and Bouet, Nathalie and Ghose, Sanjit and Dooryhee, Eric and Conley, Ray},

  abstractNote = {A new system of slits called `spiderweb slits' have been developed for depth-resolved powder or polycrystalline X-ray diffraction measurements. The slits act on diffracted X-rays to select a particular gauge volume of sample, while absorbing diffracted X-rays from outside of this volume. Although the slit geometry is to some extent similar to that of previously developed conical slits or spiral slits, this new design has advantages over the previous ones in use for complex heterogeneous materials and in situ and operando diffraction measurements. For example, the slits can measure a majority of any diffraction cone for any polycrystalline material, over a continuous range of diffraction angles, and work for X-ray energies of tens to hundreds of kiloelectronvolts. In addition, the design is generated and optimized using ray-tracing simulations, and fabricated through laser micromachining. The first prototype was successfully tested at the X17A beamline at the National Synchrotron Light Source, and shows similar performance to simulations, demonstrating gauge volume selection for standard powders, for all diffraction peaks over angles of 2–10°. A similar, but improved, design will be implemented at the X-ray Powder Diffraction beamline at the National Synchrotron Light Source II.},

  doi          = {10.1107/S1600577516013084},

  journal      = {Journal of Synchrotron Radiation (Online)},

  number       = 6,

  volume       = 23,

  place        = {United States},

  year         = {Thu Oct 06 00:00:00 EDT 2016},

  month        = {Thu Oct 06 00:00:00 EDT 2016}

}

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Works referenced in this record:

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DOI: 10.1080/07303300310001628625

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