Direct Observation of Sr Vacancies in by Quantitative Scanning Transmission Electron Microscopy
Abstract
Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of the key challenges in materials science. Here, we demonstrate that quantitative scanning transmission electron microscopy (STEM) can be used to directly observe Sr vacancies in SrTiO3 and to determine the atom column relaxations around them. By combining recent advances in quantitative STEM, including variableangle, high-angle annular dark-field imaging and rigid registration methods, with frozen phonon multislice image simulations, we identify which Sr columns contain vacancies and quantify the number of vacancies in them. Here, picometer precision measurements of the surrounding atom column positions show that the nearest-neighbor Ti atoms are displaced away from the Sr vacancies. The results open up a new methodology for studying the microscopic mechanisms by which point defects control materials properties.
- Authors:
- Publication Date:
- Research Org.:
- Univ. of California, Santa Barbara, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1337451
- Alternate Identifier(s):
- OSTI ID: 1361394
- Grant/Contract Number:
- FG02-02ER45994
- Resource Type:
- Published Article
- Journal Name:
- Physical Review. X
- Additional Journal Information:
- Journal Name: Physical Review. X Journal Volume: 6 Journal Issue: 4; Journal ID: ISSN 2160-3308
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 74 ATOMIC AND MOLECULAR PHYSICS; 36 MATERIALS SCIENCE
Citation Formats
Kim, Honggyu, Zhang, Jack Y., Raghavan, Santosh, and Stemmer, Susanne. Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy. United States: N. p., 2016.
Web. doi:10.1103/PhysRevX.6.041063.
Kim, Honggyu, Zhang, Jack Y., Raghavan, Santosh, & Stemmer, Susanne. Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy. United States. https://doi.org/10.1103/PhysRevX.6.041063
Kim, Honggyu, Zhang, Jack Y., Raghavan, Santosh, and Stemmer, Susanne. Thu .
"Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy". United States. https://doi.org/10.1103/PhysRevX.6.041063.
@article{osti_1337451,
title = {Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy},
author = {Kim, Honggyu and Zhang, Jack Y. and Raghavan, Santosh and Stemmer, Susanne},
abstractNote = {Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of the key challenges in materials science. Here, we demonstrate that quantitative scanning transmission electron microscopy (STEM) can be used to directly observe Sr vacancies in SrTiO3 and to determine the atom column relaxations around them. By combining recent advances in quantitative STEM, including variableangle, high-angle annular dark-field imaging and rigid registration methods, with frozen phonon multislice image simulations, we identify which Sr columns contain vacancies and quantify the number of vacancies in them. Here, picometer precision measurements of the surrounding atom column positions show that the nearest-neighbor Ti atoms are displaced away from the Sr vacancies. The results open up a new methodology for studying the microscopic mechanisms by which point defects control materials properties.},
doi = {10.1103/PhysRevX.6.041063},
journal = {Physical Review. X},
number = 4,
volume = 6,
place = {United States},
year = {Thu Dec 22 00:00:00 EST 2016},
month = {Thu Dec 22 00:00:00 EST 2016}
}
https://doi.org/10.1103/PhysRevX.6.041063
Web of Science
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