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The Programs
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Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
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Numerical correction of lens aberrations in phase-retrieval HRTEM
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Electron Holography: Applications to Materials Questions
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Optimum correction conditions for aberration-corrected HRTEM SiC dumbbells chemical imaging
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April 2013 |
Time-of-flight Rietveld neutron structure refinement and quantum chemistry study of Y-α-sialon
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Transmission electron microscopy with Zernike phase plate
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Calibration of the operating parameters for an HB5 stem instrument
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January 1986 |
Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy
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book
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January 2008 |
Exit wave reconstruction at atomic resolution
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July 2004 |
Background, status and future of the Transmission Electron Aberration-corrected Microscope project
- Dahmen, U.; Erni, R.; Radmilovic, V.
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Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Issue 1903, p. 3795-3808
https://doi.org/10.1098/rsta.2009.0094
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Local Measurement and Computational Refinement of Aberrations for HRTEM
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Aberration correction past and present
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Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns
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Efficient subpixel image registration algorithms
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