Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples
Abstract
We develop an automatic and objective method to measure and correct residual aberrations in atomic-resolution HRTEM complex exit waves for crystalline samples aligned along a low-index zone axis. Our method uses the approximate rotational point symmetry of a column of atoms or single atom to iteratively calculate a best-fit numerical phase plate for this symmetry condition, and does not require information about the sample thickness or precise structure. We apply our method to two experimental focal series reconstructions, imaging a β-Si3N4 wedge with O and N doping, and a single-layer graphene grain boundary. We use peak and lattice fitting to evaluate the precision of the corrected exit waves. We also apply our method to the exit wave of a Si wedge retrieved by off-axis electron holography. In all cases, the software correction of the residual aberration function improves the accuracy of the measured exit waves.
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- OSTI Identifier:
- 1333886
- Alternate Identifier(s):
- OSTI ID: 1379634
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Published Article
- Journal Name:
- Advanced Structural and Chemical Imaging
- Additional Journal Information:
- Journal Name: Advanced Structural and Chemical Imaging Journal Volume: 2 Journal Issue: 1; Journal ID: ISSN 2198-0926
- Publisher:
- Springer Science + Business Media
- Country of Publication:
- Germany
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 97 MATHEMATICS AND COMPUTING; atomic resolution HRTEM; aberration correction; inline holography; off-axis holography; wavefront sensing
Citation Formats
Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, and Ciston, Jim. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples. Germany: N. p., 2016.
Web. doi:10.1186/s40679-016-0030-1.
Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, & Ciston, Jim. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples. Germany. doi:10.1186/s40679-016-0030-1.
Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, and Ciston, Jim. Wed .
"Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples". Germany. doi:10.1186/s40679-016-0030-1.
@article{osti_1333886,
title = {Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples},
author = {Ophus, Colin and Rasool, Haider I. and Linck, Martin and Zettl, Alex and Ciston, Jim},
abstractNote = {We develop an automatic and objective method to measure and correct residual aberrations in atomic-resolution HRTEM complex exit waves for crystalline samples aligned along a low-index zone axis. Our method uses the approximate rotational point symmetry of a column of atoms or single atom to iteratively calculate a best-fit numerical phase plate for this symmetry condition, and does not require information about the sample thickness or precise structure. We apply our method to two experimental focal series reconstructions, imaging a β-Si3N4 wedge with O and N doping, and a single-layer graphene grain boundary. We use peak and lattice fitting to evaluate the precision of the corrected exit waves. We also apply our method to the exit wave of a Si wedge retrieved by off-axis electron holography. In all cases, the software correction of the residual aberration function improves the accuracy of the measured exit waves.},
doi = {10.1186/s40679-016-0030-1},
journal = {Advanced Structural and Chemical Imaging},
number = 1,
volume = 2,
place = {Germany},
year = {2016},
month = {11}
}
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DOI: 10.1186/s40679-016-0030-1
DOI: 10.1186/s40679-016-0030-1
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