skip to main content


Title: Compact forced simple-shear sample for studying shear localization in materials

In this paper, a new specimen geometry, the compact forced-simple-shear specimen (CFSS), has been developed as a means to achieve simple shear testing of materials over a range of temperatures and strain rates. The stress and strain state in the gage section is designed to produce essentially “pure” simple shear, mode II in-plane shear, in a compact-sample geometry. The 2-D plane of shear can be directly aligned along specified directional aspects of a material's microstructure of interest; i.e., systematic shear loading parallel, at 45°, and orthogonal to anisotropic microstructural features in a material such as the pancake-shaped grains typical in many rolled structural metals, or to specified directions in fiber-reinforced composites. Finally, the shear-stress shear-strain response and the damage evolution parallel and orthogonal to the pancake grain morphology in 7039-Al are shown to vary significantly as a function of orientation to the microstructure.
 [1] ;  [2] ;  [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States). Materials Science and Technology Division
  2. Univ. of California, San Diego, CA (United States). Dept. of NanoEngineering
Publication Date:
Report Number(s):
Journal ID: ISSN 1359-6454
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Acta Materialia
Additional Journal Information:
Journal Volume: 103; Journal ID: ISSN 1359-6454
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA); USDOD
Contributing Orgs:
Univ. of California, San Diego, CA (United States)
Country of Publication:
United States
36 MATERIALS SCIENCE; Shear localization; Anisotropy; Microstructure; Sample geometry
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1398075