skip to main content

DOE PAGESDOE PAGES

Title: Devices for SRF material characterization

The surface resistance Rs of superconducting materials can be obtained by measuring the quality factor of an elliptical cavity excited in a transverse magnetic mode (TM010). The value obtained has however to be taken as averaged over the whole surface. A more convenient way to obtain Rs, especially of materials which are not yet technologically ready for cavity production, is to measure small samples instead. These can be easily man ufactured at low cost, duplicated and placed in film deposition and surface analytical tools. A commonly used design for a device to measure Rs consists of a cylindrical cavity excited in a transverse electric (TE110) mode with the sample under test serving as one replaceable endplate. Such a cavity has two drawbacks. For reasonably small samples the resonant frequency will be larger than frequencies of interest concerning SRF application and it requires a reference sample of known Rs. In this article we review several devices which have been designed to overcome these limitations, reaching sub - nΩ resolution in some cases. Some of these devices also comprise a parameter space in frequency and temperature which is inaccessible to standard cavity tests, making them ideal tools to test theoretical surface resistancemore » models.« less
Authors:
 [1] ;  [2] ;  [3]
  1. STFC Daresbury Lab. (United Kingdom). Cockcroft Inst. of Accelerator Science and Technology (AST)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. TRIUMF, Vancouver, BC (Canada); Helmholtz-Zentrum Berlin (HZB), (Germany). German Research Centre for Materials and Energy
Publication Date:
Report Number(s):
BNL-112739-2016-JA
Journal ID: ISSN 0953-2048; R&D Project: KBCH139; 18034; KB0202011; TRN: US1700109
Grant/Contract Number:
SC00112704; AC02-98CH10886; SC0004410; AC05-06OR23177
Type:
Accepted Manuscript
Journal Name:
Superconductor Science and Technology
Additional Journal Information:
Journal Volume: 30; Journal Issue: 1; Journal ID: ISSN 0953-2048
Publisher:
IOP Publishing
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Nuclear Physics (NP) (SC-26)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS
OSTI Identifier:
1329797
Alternate Identifier(s):
OSTI ID: 1332138

Goudket, Philippe, Xiao, B., and Junginger, T.. Devices for SRF material characterization. United States: N. p., Web. doi:10.1088/0953-2048/30/1/013001.
Goudket, Philippe, Xiao, B., & Junginger, T.. Devices for SRF material characterization. United States. doi:10.1088/0953-2048/30/1/013001.
Goudket, Philippe, Xiao, B., and Junginger, T.. 2016. "Devices for SRF material characterization". United States. doi:10.1088/0953-2048/30/1/013001. https://www.osti.gov/servlets/purl/1329797.
@article{osti_1329797,
title = {Devices for SRF material characterization},
author = {Goudket, Philippe and Xiao, B. and Junginger, T.},
abstractNote = {The surface resistance Rs of superconducting materials can be obtained by measuring the quality factor of an elliptical cavity excited in a transverse magnetic mode (TM010). The value obtained has however to be taken as averaged over the whole surface. A more convenient way to obtain Rs, especially of materials which are not yet technologically ready for cavity production, is to measure small samples instead. These can be easily man ufactured at low cost, duplicated and placed in film deposition and surface analytical tools. A commonly used design for a device to measure Rs consists of a cylindrical cavity excited in a transverse electric (TE110) mode with the sample under test serving as one replaceable endplate. Such a cavity has two drawbacks. For reasonably small samples the resonant frequency will be larger than frequencies of interest concerning SRF application and it requires a reference sample of known Rs. In this article we review several devices which have been designed to overcome these limitations, reaching sub - nΩ resolution in some cases. Some of these devices also comprise a parameter space in frequency and temperature which is inaccessible to standard cavity tests, making them ideal tools to test theoretical surface resistance models.},
doi = {10.1088/0953-2048/30/1/013001},
journal = {Superconductor Science and Technology},
number = 1,
volume = 30,
place = {United States},
year = {2016},
month = {10}
}