Devices for SRF material characterization

Goudket, Philippe; Xiao, B.; Junginger, T.

doi:10.1088/0953-2048/30/1/013001

Title: Devices for SRF material characterization

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Abstract

The surface resistance Rs of superconducting materials can be obtained by measuring the quality factor of an elliptical cavity excited in a transverse magnetic mode (TM010). The value obtained has however to be taken as averaged over the whole surface. A more convenient way to obtain Rs, especially of materials which are not yet technologically ready for cavity production, is to measure small samples instead. These can be easily man ufactured at low cost, duplicated and placed in film deposition and surface analytical tools. A commonly used design for a device to measure Rs consists of a cylindrical cavity excited in a transverse electric (TE110) mode with the sample under test serving as one replaceable endplate. Such a cavity has two drawbacks. For reasonably small samples the resonant frequency will be larger than frequencies of interest concerning SRF application and it requires a reference sample of known Rs. In this article we review several devices which have been designed to overcome these limitations, reaching sub - nΩ resolution in some cases. Some of these devices also comprise a parameter space in frequency and temperature which is inaccessible to standard cavity tests, making them ideal tools to test theoretical surface resistancemore » models.« less

Authors:

Goudket, Philippe ^[1]; Xiao, B. ^[2]; Junginger, T. ^[3]

STFC Daresbury Lab. (United Kingdom). Cockcroft Inst. of Accelerator Science and Technology (AST)
Brookhaven National Lab. (BNL), Upton, NY (United States)
TRIUMF, Vancouver, BC (Canada); Helmholtz-Zentrum Berlin (HZB), (Germany). German Research Centre for Materials and Energy

Publication Date:: Fri Oct 07 00:00:00 EDT 2016

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Nuclear Physics (NP)

OSTI Identifier:: 1329797

Alternate Identifier(s):: OSTI ID: 1332138

Report Number(s):: BNL-112739-2016-JA
Journal ID: ISSN 0953-2048; R&D Project: KBCH139; 18034; KB0202011; TRN: US1700109

Grant/Contract Number:: SC00112704; AC02-98CH10886; SC0004410; AC05-06OR23177

Resource Type:: Accepted Manuscript

Journal Name:: Superconductor Science and Technology

Additional Journal Information:: Journal Volume: 30; Journal Issue: 1; Journal ID: ISSN 0953-2048

Publisher:: IOP Publishing

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS

Citation Formats


                    Goudket, Philippe, Xiao, B., and Junginger, T. Devices for SRF material characterization.  United States: N. p., 2016. 
Web.  doi:10.1088/0953-2048/30/1/013001.

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                    Goudket, Philippe, Xiao, B., & Junginger, T. Devices for SRF material characterization.  United States.  https://doi.org/10.1088/0953-2048/30/1/013001

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                    Goudket, Philippe, Xiao, B., and Junginger, T. Fri .  
"Devices for SRF material characterization".  United States.  https://doi.org/10.1088/0953-2048/30/1/013001.  https://www.osti.gov/servlets/purl/1329797.

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@article{osti_1329797,

  title        = {Devices for SRF material characterization},

  author       = {Goudket, Philippe and Xiao, B. and Junginger, T.},

  abstractNote = {The surface resistance Rs of superconducting materials can be obtained by measuring the quality factor of an elliptical cavity excited in a transverse magnetic mode (TM010). The value obtained has however to be taken as averaged over the whole surface. A more convenient way to obtain Rs, especially of materials which are not yet technologically ready for cavity production, is to measure small samples instead. These can be easily man ufactured at low cost, duplicated and placed in film deposition and surface analytical tools. A commonly used design for a device to measure Rs consists of a cylindrical cavity excited in a transverse electric (TE110) mode with the sample under test serving as one replaceable endplate. Such a cavity has two drawbacks. For reasonably small samples the resonant frequency will be larger than frequencies of interest concerning SRF application and it requires a reference sample of known Rs. In this article we review several devices which have been designed to overcome these limitations, reaching sub - nΩ resolution in some cases. Some of these devices also comprise a parameter space in frequency and temperature which is inaccessible to standard cavity tests, making them ideal tools to test theoretical surface resistance models.},

  doi          = {10.1088/0953-2048/30/1/013001},

  journal      = {Superconductor Science and Technology},

  number       = 1,

  volume       = 30,

  place        = {United States},

  year         = {Fri Oct 07 00:00:00 EDT 2016},

  month        = {Fri Oct 07 00:00:00 EDT 2016}

}

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