DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Dynamic scan control in STEM: spiral scans

Journal Article · · Advanced Structural and Chemical Imaging

Abstract Scanning transmission electron microscopy (STEM) has emerged as one of the foremost techniques to analyze materials at atomic resolution. However, two practical difficulties inherent to STEM imaging are: radiation damage imparted by the electron beam, which can potentially damage or otherwise modify the specimen and slow-scan image acquisition, which limits the ability to capture dynamic changes at high temporal resolution. Furthermore, due in part to scan flyback corrections, typical raster scan methods result in an uneven distribution of dose across the scanned area. A method to allow extremely fast scanning with a uniform residence time would enable imaging at low electron doses, ameliorating radiation damage and at the same time permitting image acquisition at higher frame-rates while maintaining atomic resolution. The practical complication is that rastering the STEM probe at higher speeds causes significant image distortions. Non-square scan patterns provide a solution to this dilemma and can be tailored for low dose imaging conditions. Here, we develop a method for imaging with alternative scan patterns and investigate their performance at very high scan speeds. A general analysis for spiral scanning is presented here for the following spiral scan functions: Archimedean, Fermat, and constant linear velocity spirals, which were tested for STEM imaging. The quality of spiral scan STEM images is generally comparable with STEM images from conventional raster scans, and the dose uniformity can be improved.

Sponsoring Organization:
USDOE
OSTI ID:
1256773
Journal Information:
Advanced Structural and Chemical Imaging, Journal Name: Advanced Structural and Chemical Imaging Journal Issue: 1 Vol. 2; ISSN 2198-0926
Publisher:
Springer Science + Business MediaCopyright Statement
Country of Publication:
Germany
Language:
English

References (18)

Electron Energy-Loss Spectroscopy in the Electron Microscope book January 2011
Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge journal March 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution journal April 2015
Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions journal March 2016
Single-particle electron cryo-microscopy: towards atomic resolution journal November 2000
Single Atom Microscopy journal November 2012
Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope journal May 2013
Graphene Reknits Its Holes journal July 2012
Imaging atomic-level random walk of a point defect in graphene journal May 2014
Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts journal June 2014
Flexible metallic nanowires with self-adaptive contacts to semiconducting transition-metal dichalcogenide monolayers journal April 2014
Electron microscopy of whole cells in liquid with nanometer resolution journal January 2009
Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry journal June 2009
Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data journal July 2013
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images journal October 2013
Direct Observation of Dopant Atom Diffusion in a Bulk Semiconductor Crystal Enhanced by a Large Size Mismatch journal October 2014
An approach to the systematic distortion correction in aberration-corrected HAADF images journal January 2006
Smart Align—a new tool for robust non-rigid registration of scanning microscope data journal July 2015

Similar Records

Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
Journal Article · Wed Mar 08 04:00:00 UTC 2017 · Scientific Reports · OSTI ID:1394477

High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques
Journal Article · Mon May 06 04:00:00 UTC 2024 · Journal of Microscopy · OSTI ID:2346227

The Potential for Bayesian Compressive Sensing to Significantly Reduce Electron Dose in High Resolution STEM Images
Journal Article · Tue Feb 11 04:00:00 UTC 2014 · Journal of Electron Microscopy, 63(1):41 - 51 · OSTI ID:1129350

Related Subjects