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Title: Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films

Authors:
 [1] ;  [2] ;  [3] ; ORCiD logo [3] ;  [4] ;  [5] ;  [5] ;  [5] ;  [6] ;  [5] ;  [5] ; ORCiD logo [4]
  1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of Oregon, Eugene, Oregon 97401, USA
  2. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of California, Santa Cruz, California 94056, USA
  3. IFW Dresden, Institute for Metallic Materials, Helmholtzstr. 20, D-01069 Dresden, Germany
  4. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of Oregon, Eugene, Oregon 97401, USA, Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  5. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  6. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, National Synchrotron Radiation Research Center (NSRRC), 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan
Publication Date:
Grant/Contract Number:
FG02-11ER46831; AC02-05-CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 108 Journal Issue: 9; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1240034

Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., and Kevan, S. D.. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films. United States: N. p., Web. doi:10.1063/1.4942776.
Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., & Kevan, S. D.. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films. United States. doi:10.1063/1.4942776.
Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., and Kevan, S. D.. 2016. "Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films". United States. doi:10.1063/1.4942776.
@article{osti_1240034,
title = {Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films},
author = {Shi, X. and Fischer, P. and Neu, V. and Elefant, D. and Lee, J. C. T. and Shapiro, D. A. and Farmand, M. and Tyliszczak, T. and Shiu, H. -W. and Marchesini, S. and Roy, S. and Kevan, S. D.},
abstractNote = {},
doi = {10.1063/1.4942776},
journal = {Applied Physics Letters},
number = 9,
volume = 108,
place = {United States},
year = {2016},
month = {3}
}