Imaging local electric fields produced upon synchrotron X-ray exposure
Abstract
Electron–hole separation following hard X-ray absorption during diffraction analysis of soft materials under cryogenic conditions produces substantial local electric fields visualizable by second harmonic generation (SHG) microscopy. Monte Carlo simulations of X-ray photoelectron trajectories suggest the formation of substantial local electric fields in the regions adjacent to those exposed to X-rays, indicating a possible electric-field–induced SHG (EFISH) mechanism for generating the observed signal. In studies of amorphous vitreous solvents, analysis of the SHG spatial profiles following X-ray microbeam exposure was consistent with an EFISH mechanism. Within protein crystals, exposure to 12-keV (1.033-Å) X-rays resulted in increased SHG in the region extending ~3 μm beyond the borders of the X-ray beam. Moderate X-ray exposures typical of those used for crystal centering by raster scanning through an X-ray beam were sufficient to produce static electric fields easily detectable by SHG. The X-ray–induced SHG activity was observed with no measurable loss for longer than 2 wk while maintained under cryogenic conditions, but disappeared if annealed to room temperature for a few seconds. In conclusion, these results provide direct experimental observables capable of validating simulations of X-ray–induced damage within soft materials. Additionally, X-ray–induced local fields may potentially impact diffraction resolution through localized piezoelectric distortionsmore »
- Authors:
-
- Department of Chemistry, Purdue University, West Lafayette, IN 47907, and
- The General Medical Sciences and Cancer Institutes Structural Biology Facility at Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439
- Publication Date:
- Research Org.:
- Energy Frontier Research Centers (EFRC) (United States). Center for Direct Catalytic Conversion of Biomass to Biofuels (C3Bio)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); US National Institutes of Health (NIH)
- Contributing Org.:
- C3Bio partners with Purdue University (lead); Argonne National Laboratory; National Renewable Energy Laboratory; Northeastern University; University of Tennessee
- OSTI Identifier:
- 1235100
- Alternate Identifier(s):
- OSTI ID: 1210418
- Grant/Contract Number:
- AC02-06CH11357; SC0000997; NIH-R01GM103401; NIH-R01GM103910
- Resource Type:
- Published Article
- Journal Name:
- Proceedings of the National Academy of Sciences of the United States of America
- Additional Journal Information:
- Journal Name: Proceedings of the National Academy of Sciences of the United States of America Journal Volume: 112 Journal Issue: 3; Journal ID: ISSN 0027-8424
- Publisher:
- Proceedings of the National Academy of Sciences
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; catalysis (homogeneous); catalysis (heterogeneous); biofuels (including algae and biomass); bio-inspired; materials and chemistry by design; synthesis (self-assembly); synthesis (scalable processing); structural biology; piezoelectric; X-ray damage; synchrotron; EFISH
Citation Formats
Dettmar, Christopher M., Newman, Justin A., Toth, Scott J., Becker, Michael, Fischetti, Robert F., and Simpson, Garth J. Imaging local electric fields produced upon synchrotron X-ray exposure. United States: N. p., 2014.
Web. doi:10.1073/pnas.1407771112.
Dettmar, Christopher M., Newman, Justin A., Toth, Scott J., Becker, Michael, Fischetti, Robert F., & Simpson, Garth J. Imaging local electric fields produced upon synchrotron X-ray exposure. United States. https://doi.org/10.1073/pnas.1407771112
Dettmar, Christopher M., Newman, Justin A., Toth, Scott J., Becker, Michael, Fischetti, Robert F., and Simpson, Garth J. Wed .
"Imaging local electric fields produced upon synchrotron X-ray exposure". United States. https://doi.org/10.1073/pnas.1407771112.
@article{osti_1235100,
title = {Imaging local electric fields produced upon synchrotron X-ray exposure},
author = {Dettmar, Christopher M. and Newman, Justin A. and Toth, Scott J. and Becker, Michael and Fischetti, Robert F. and Simpson, Garth J.},
abstractNote = {Electron–hole separation following hard X-ray absorption during diffraction analysis of soft materials under cryogenic conditions produces substantial local electric fields visualizable by second harmonic generation (SHG) microscopy. Monte Carlo simulations of X-ray photoelectron trajectories suggest the formation of substantial local electric fields in the regions adjacent to those exposed to X-rays, indicating a possible electric-field–induced SHG (EFISH) mechanism for generating the observed signal. In studies of amorphous vitreous solvents, analysis of the SHG spatial profiles following X-ray microbeam exposure was consistent with an EFISH mechanism. Within protein crystals, exposure to 12-keV (1.033-Å) X-rays resulted in increased SHG in the region extending ~3 μm beyond the borders of the X-ray beam. Moderate X-ray exposures typical of those used for crystal centering by raster scanning through an X-ray beam were sufficient to produce static electric fields easily detectable by SHG. The X-ray–induced SHG activity was observed with no measurable loss for longer than 2 wk while maintained under cryogenic conditions, but disappeared if annealed to room temperature for a few seconds. In conclusion, these results provide direct experimental observables capable of validating simulations of X-ray–induced damage within soft materials. Additionally, X-ray–induced local fields may potentially impact diffraction resolution through localized piezoelectric distortions of the lattice.},
doi = {10.1073/pnas.1407771112},
journal = {Proceedings of the National Academy of Sciences of the United States of America},
number = 3,
volume = 112,
place = {United States},
year = {Wed Dec 31 00:00:00 EST 2014},
month = {Wed Dec 31 00:00:00 EST 2014}
}
https://doi.org/10.1073/pnas.1407771112
Web of Science
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