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Title: A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas

Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Cornell University, Electrical and Computer Engineering, Ithaca, NY 14853, USA
Publication Date:
Grant/Contract Number:
NA0001836
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 85 Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1224237

Cahill, Adam D., Hoyt, Cad L., Pikuz, Sergei A., Shelkovenko, Tania, and Hammer, David A.. A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas. United States: N. p., Web. doi:10.1063/1.4898339.
Cahill, Adam D., Hoyt, Cad L., Pikuz, Sergei A., Shelkovenko, Tania, & Hammer, David A.. A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas. United States. doi:10.1063/1.4898339.
Cahill, Adam D., Hoyt, Cad L., Pikuz, Sergei A., Shelkovenko, Tania, and Hammer, David A.. 2014. "A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas". United States. doi:10.1063/1.4898339.
@article{osti_1224237,
title = {A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas},
author = {Cahill, Adam D. and Hoyt, Cad L. and Pikuz, Sergei A. and Shelkovenko, Tania and Hammer, David A.},
abstractNote = {},
doi = {10.1063/1.4898339},
journal = {Review of Scientific Instruments},
number = 10,
volume = 85,
place = {United States},
year = {2014},
month = {10}
}