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Title: Accurate determination of segmented X-ray detector geometry

Recent advances in X-ray detector technology have resulted in the introduction of segmented detectors composed of many small detector modules tiled together to cover a large detection area. Due to mechanical tolerances and the desire to be able to change the module layout to suit the needs of different experiments, the pixels on each module might not align perfectly on a regular grid. Several detectors are designed to permit detector sub-regions (or modules) to be moved relative to each other for different experiments. Accurate determination of the location of detector elements relative to the beam-sample interaction point is critical for many types of experiment, including X-ray crystallography, coherent diffractive imaging (CDI), small angle X-ray scattering (SAXS) and spectroscopy. For detectors with moveable modules, the relative positions of pixels are no longer fixed, necessitating the development of a simple procedure to calibrate detector geometry after reconfiguration. We describe a simple and robust method for determining the geometry of segmented X-ray detectors using measurements obtained by serial crystallography. By comparing the location of observed Bragg peaks to the spot locations predicted from the crystal indexing procedure, the position, rotation and distance of each module relative to the interaction region can be refined.more » Furthermore, we show that the refined detector geometry greatly improves the results of experiments.« less
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [1]
  1. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg, Hamburg (Germany); Centre for Ultrafast Imaging, Hamburg (Germany)
Publication Date:
Grant/Contract Number:
P41GM103393; P41RR001209; AC02-76SF00515
Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 23; Journal Issue: 22; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Univ. of Hamburg, Hamburg (Germany)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; detection; metrology; X-rays; soft x-rays; extreme ultraviolet; diffraction
OSTI Identifier:
1224153
Alternate Identifier(s):
OSTI ID: 1234724; OSTI ID: 1239271