Nucleation and Growth of Crystalline Grains in RF-Sputtered TiO 2 Films
Abstract
Amorphous thin films were radio frequency sputtered onto siliconmonoxide and carbon support films on molybdenum transmission electron microscope (TEM) grids and observed during in situ annealing in a TEM heating stage at C. The evolution of crystallization is consistent with a classical model of homogeneous nucleation and isotropic grain growth. The two-dimensional grain morphology of the TEM foil allowed straightforward recognition of amorphous and crystallized regions of the films, for measurement of crystalline volume fraction and grain number density. By assuming that the kinetic parameters remain constant beyond the onset of crystallization, the final average grain size was computed, using an analytical extrapolation to the fully crystallized state. Electron diffraction reveals a predominance of the anatase crystallographic phase.
- Authors:
-
- Physics Department, South Dakota School of Mines & Technology, Rapid City, SD 57701, USA
- Nanoscience and Nanoengineering Department, South Dakota School of Mines & Technology, Rapid City, SD 57701, USA
- Electrical Engineering Department, South Dakota State University, Brookings, SD 57007, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1198252
- Grant/Contract Number:
- DOE DE-FG02-08ER64624
- Resource Type:
- Published Article
- Journal Name:
- Research Letters in Nanotechnology
- Additional Journal Information:
- Journal Name: Research Letters in Nanotechnology Journal Volume: 2009; Journal ID: ISSN 1687-6849
- Publisher:
- Hindawi Publishing Corporation
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
Citation Formats
Johnson, J. C., Ahrenkiel, S. P., Dutta, P., and Bommisetty, V. R. Nucleation and Growth of Crystalline Grains in RF-Sputtered TiO 2 Films. Country unknown/Code not available: N. p., 2009.
Web. doi:10.1155/2009/280797.
Johnson, J. C., Ahrenkiel, S. P., Dutta, P., & Bommisetty, V. R. Nucleation and Growth of Crystalline Grains in RF-Sputtered TiO 2 Films. Country unknown/Code not available. https://doi.org/10.1155/2009/280797
Johnson, J. C., Ahrenkiel, S. P., Dutta, P., and Bommisetty, V. R. Thu .
"Nucleation and Growth of Crystalline Grains in RF-Sputtered TiO 2 Films". Country unknown/Code not available. https://doi.org/10.1155/2009/280797.
@article{osti_1198252,
title = {Nucleation and Growth of Crystalline Grains in RF-Sputtered TiO 2 Films},
author = {Johnson, J. C. and Ahrenkiel, S. P. and Dutta, P. and Bommisetty, V. R.},
abstractNote = {Amorphous TiO 2 thin films were radio frequency sputtered onto siliconmonoxide and carbon support films on molybdenum transmission electron microscope (TEM) grids and observed during in situ annealing in a TEM heating stage at 250 ∘ C. The evolution of crystallization is consistent with a classical model of homogeneous nucleation and isotropic grain growth. The two-dimensional grain morphology of the TEM foil allowed straightforward recognition of amorphous and crystallized regions of the films, for measurement of crystalline volume fraction and grain number density. By assuming that the kinetic parameters remain constant beyond the onset of crystallization, the final average grain size was computed, using an analytical extrapolation to the fully crystallized state. Electron diffraction reveals a predominance of the anatase crystallographic phase.},
doi = {10.1155/2009/280797},
journal = {Research Letters in Nanotechnology},
number = ,
volume = 2009,
place = {Country unknown/Code not available},
year = {Thu Jan 01 00:00:00 EST 2009},
month = {Thu Jan 01 00:00:00 EST 2009}
}
https://doi.org/10.1155/2009/280797
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