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Title: Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1074674
Resource Type:
Published Article
Journal Name:
Physical Review Special Topics - Accelerators and Beams
Additional Journal Information:
Journal Volume: 16; Journal Issue: 2; Journal ID: ISSN 1098-4402
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., and Lukaszew, R. A. Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications. United States: N. p., 2013. Web. doi:10.1103/PhysRevSTAB.16.022001.
Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., & Lukaszew, R. A. Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications. United States. doi:10.1103/PhysRevSTAB.16.022001.
Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., and Lukaszew, R. A. Tue . "Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications". United States. doi:10.1103/PhysRevSTAB.16.022001.
@article{osti_1074674,
title = {Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications},
author = {Beringer, D. B. and Roach, W. M. and Clavero, C. and Reece, C. E. and Lukaszew, R. A.},
abstractNote = {},
doi = {10.1103/PhysRevSTAB.16.022001},
journal = {Physical Review Special Topics - Accelerators and Beams},
number = 2,
volume = 16,
place = {United States},
year = {2013},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevSTAB.16.022001

Citation Metrics:
Cited by: 5 works
Citation information provided by
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