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Title: Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy

Abstract

A system is provided. The system has a femtosecond oscillator to generate pulses used for pump and probe beams. A photonic crystal fiber is disposed in a path of the probe beam and produces pulses for a chirped probe beam. A high NA objective receives the pump and the chirped probe beam, redirects the received beams through a dielectric substrate towards an interface between a sample and the dielectric substrate to cause total internal reflection (TIR) at the sample-substrate interface, and produces corresponding evanescent waves in a portion of the sample adjacent to the sample-substrate interface, and collects a backward-propagating beam of pulses of responsive light. The portion of the sample illuminated by the evanescent waves emits responsive light. The dielectric substrate is transparent to the responsive light, the pump and the chirped probe beam. An image is produced having a specific image size using the received backward-propagating beam.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1987220
Patent Number(s):
11604144
Application Number:
17/240,514
Assignee:
UT-Battelle LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 04/26/2021
Country of Publication:
United States
Language:
English

Citation Formats

Doughty, Benjamin L., and Ma, Yingzhong. Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy. United States: N. p., 2023. Web.
Doughty, Benjamin L., & Ma, Yingzhong. Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy. United States.
Doughty, Benjamin L., and Ma, Yingzhong. Tue . "Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy". United States. https://www.osti.gov/servlets/purl/1987220.
@article{osti_1987220,
title = {Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy},
author = {Doughty, Benjamin L. and Ma, Yingzhong},
abstractNote = {A system is provided. The system has a femtosecond oscillator to generate pulses used for pump and probe beams. A photonic crystal fiber is disposed in a path of the probe beam and produces pulses for a chirped probe beam. A high NA objective receives the pump and the chirped probe beam, redirects the received beams through a dielectric substrate towards an interface between a sample and the dielectric substrate to cause total internal reflection (TIR) at the sample-substrate interface, and produces corresponding evanescent waves in a portion of the sample adjacent to the sample-substrate interface, and collects a backward-propagating beam of pulses of responsive light. The portion of the sample illuminated by the evanescent waves emits responsive light. The dielectric substrate is transparent to the responsive light, the pump and the chirped probe beam. An image is produced having a specific image size using the received backward-propagating beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 14 00:00:00 EDT 2023},
month = {Tue Mar 14 00:00:00 EDT 2023}
}

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