Title: Systems and methods for selective detection and imaging in coherent Raman microscopy by spectral excitation shaping

Abstract

A microscopy imaging system is disclosed that includes a light source system, a spectral shaper, a modulator system, an optics system, an optical detector and a processor. The light source system is for providing a first train of pulses and a second train of pulses. The spectral shaper is for spectrally modifying an optical property of at least some frequency components of the broadband range of frequency components such that the broadband range of frequency components is shaped producing a shaped first train of pulses to specifically probe a spectral feature of interest from a sample, and to reduce information from features that are not of interest from the sample. The modulator system is for modulating a property of at least one of the shaped first train of pulses and the second train of pulses at a modulation frequency. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of a train of pulses of interest transmitted or reflected through the common focal volume. The processor is for detecting a modulation at the modulation frequency of the integrated intensity of substantially all of the optical frequency components of the train of pulses of interest duemore » to the non-linear interaction of the shaped first train of pulses with the second train of pulses as modulated in the common focal volume, and for providing an output signal for a pixel of an image for the microscopy imaging system. « less

Inventors:

Xie, Xiaoliang Sunney; Freudiger, Christian; Min, Wei

Issue Date:

2016-03-15

Research Org.:

Harvard Univ., Cambridge, MA (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1243043

Patent Number(s):

9285575

Application Number:

12/690,579

Assignee:

President and Fellows of Harvard College (Cambridge, MA)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Show more

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

G01J2003/1282 - {Spectrum tailoring}
G01J3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
G01J3/44 - Raman spectrometry

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N2021/653 - {Coherent methods [CARS]}
G01N2021/655 - {Stimulated Raman}
G01N21/65 - Raman scattering
G01N2201/0675 - SLM

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

G02B21/002 - {Scanning microscopes
G02B21/082 - {for incident illumination only}

Show less

DOE Contract Number:  

FG02-07ER15875

Resource Type:

Patent

Resource Relation:

Patent File Date: 2010 Jan 20

Country of Publication:

United States

Language:

English

Subject:

47 OTHER INSTRUMENTATION; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY