High resolution, non-contact removal rate module for serial sectioning
Abstract
The present invention relates to a metallographic system including a measurement module configured to provide precise differential measurements of a sample after serial sectioning, as well as methods of employing such a module. In particular example, the measurement module provides differential measurement(s) without contacting the surface of a sample, thereby minimizing contamination of the sample surface.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1568200
- Patent Number(s):
- 10260865
- Application Number:
- 15/705,178
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
- DOE Contract Number:
- NA0003525
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 09/14/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Madison, Jonathan D., and Huffman, Elizabeth M. High resolution, non-contact removal rate module for serial sectioning. United States: N. p., 2019.
Web.
Madison, Jonathan D., & Huffman, Elizabeth M. High resolution, non-contact removal rate module for serial sectioning. United States.
Madison, Jonathan D., and Huffman, Elizabeth M. Tue .
"High resolution, non-contact removal rate module for serial sectioning". United States. https://www.osti.gov/servlets/purl/1568200.
@article{osti_1568200,
title = {High resolution, non-contact removal rate module for serial sectioning},
author = {Madison, Jonathan D. and Huffman, Elizabeth M.},
abstractNote = {The present invention relates to a metallographic system including a measurement module configured to provide precise differential measurements of a sample after serial sectioning, as well as methods of employing such a module. In particular example, the measurement module provides differential measurement(s) without contacting the surface of a sample, thereby minimizing contamination of the sample surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {4}
}
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