High resolution, non-contact removal rate module for serial sectioning

Title: High resolution, non-contact removal rate module for serial sectioning

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Abstract

The present invention relates to a metallographic system including a measurement module configured to provide precise differential measurements of a sample after serial sectioning, as well as methods of employing such a module. In particular example, the measurement module provides differential measurement(s) without contacting the surface of a sample, thereby minimizing contamination of the sample surface.

Inventors:: Madison, Jonathan D.; Huffman, Elizabeth M.

Issue Date:: 2019-04-16

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1568200

Patent Number(s):: 10260865

Application Number:: 15/705,178

Assignee:: National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/3563 - for analysing solids

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/0608 - {Height gauges}

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/65 - Raman scattering

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DOE Contract Number:: NA0003525

Resource Type:: Patent

Resource Relation:: Patent File Date: 09/14/2017

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE

Citation Formats


                    Madison, Jonathan D., and Huffman, Elizabeth M. High resolution, non-contact removal rate module for serial sectioning.  United States: N. p., 2019. 
        Web.

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                    Madison, Jonathan D., & Huffman, Elizabeth M. High resolution, non-contact removal rate module for serial sectioning.  United States.

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                    Madison, Jonathan D., and Huffman, Elizabeth M. Tue .  
        "High resolution, non-contact removal rate module for serial sectioning".  United States.  https://www.osti.gov/servlets/purl/1568200.

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@article{osti_1568200,

  title        = {High resolution, non-contact removal rate module for serial sectioning},

  author       = {Madison, Jonathan D. and Huffman, Elizabeth M.},

  abstractNote = {The present invention relates to a metallographic system including a measurement module configured to provide precise differential measurements of a sample after serial sectioning, as well as methods of employing such a module. In particular example, the measurement module provides differential measurement(s) without contacting the surface of a sample, thereby minimizing contamination of the sample surface.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {4}

}

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