High resolution non-contact interior profilometer
Abstract
Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.
- Inventors:
-
- Los Alamos, NM
- Largo, FL
- Tampa, FL
- Issue Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- OSTI Identifier:
- 873718
- Patent Number(s):
- 6229617
- Assignee:
- Regents of University of California (Los Alamos, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- resolution; non-contact; interior; profilometer; apparatus; method; inspecting; surfaces; devices; vessels; single; entry; laser; energy; launched; vessel; light; reflected; interfered; reference; produce; interference; pattern; analyzed; reveal; information; condition; device; inspected; reference laser; light reflected; interference pattern; interior surface; interior surfaces; laser energy; /356/
Citation Formats
Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, and Teti, John J. High resolution non-contact interior profilometer. United States: N. p., 2001.
Web.
Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, & Teti, John J. High resolution non-contact interior profilometer. United States.
Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, and Teti, John J. Mon .
"High resolution non-contact interior profilometer". United States. https://www.osti.gov/servlets/purl/873718.
@article{osti_873718,
title = {High resolution non-contact interior profilometer},
author = {Piltch, Martin S and Patterson, R Alan and Leeches, Gerald W and Nierop, John Van and Teti, John J},
abstractNote = {Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2001},
month = {Mon Jan 01 00:00:00 EST 2001}
}