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Title: High resolution non-contact interior profilometer

Abstract

Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.

Inventors:
 [1];  [1];  [1];  [2];  [3]
  1. Los Alamos, NM
  2. Largo, FL
  3. Tampa, FL
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
OSTI Identifier:
873718
Patent Number(s):
6229617
Assignee:
Regents of University of California (Los Alamos, NM)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
resolution; non-contact; interior; profilometer; apparatus; method; inspecting; surfaces; devices; vessels; single; entry; laser; energy; launched; vessel; light; reflected; interfered; reference; produce; interference; pattern; analyzed; reveal; information; condition; device; inspected; reference laser; light reflected; interference pattern; interior surface; interior surfaces; laser energy; /356/

Citation Formats

Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, and Teti, John J. High resolution non-contact interior profilometer. United States: N. p., 2001. Web.
Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, & Teti, John J. High resolution non-contact interior profilometer. United States.
Piltch, Martin S, Patterson, R Alan, Leeches, Gerald W, Nierop, John Van, and Teti, John J. Mon . "High resolution non-contact interior profilometer". United States. https://www.osti.gov/servlets/purl/873718.
@article{osti_873718,
title = {High resolution non-contact interior profilometer},
author = {Piltch, Martin S and Patterson, R Alan and Leeches, Gerald W and Nierop, John Van and Teti, John J},
abstractNote = {Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {1}
}