U.S. Department of EnergyOffice of Scientific and Technical Information
Short-Lived Intermediate in the N2O Generation by P450 NO Reductase Captured by Time-Resolved IR Spectroscopy and XFEL Crystallography
Abstract
Diffraction images were collected using an MX300-HS CCD detector. For each cryoloop, 2D raster scan with 50 μm step in each direction was performed twice. In the second pass, the raster-scan grid was shifted 25 μm in each direction. In cheetah directory, - {puck_name}/{pin_id}_hits.h5 correspond to the first scan, and - {puck_name}/{pin_id}-2_hits.h5 correspond to the second scan.
- Authors:
- Publication Date:
- Other Number(s):
- CXIDB ID 179
- DOE Contract Number:
- AC02-05CH11231
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; Kyoto University, University of Tokyo, University of Tsukuba, RIKEN SPring-8 Center
- Sponsoring Org.:
- Kyoto University, University of Tokyo, University of Tsukuba, RIKEN SPring-8 Center
- Keywords:
- SACLA; XFEL; Fixed Target Serial Femtosecond Crystallography; X-ray Free-electorn Lasers; BL3; P450nor
- OSTI Identifier:
- 1783177
- DOI:
- https://doi.org/10.11577/1783177
Citation Formats
Nomura, Takashi. Short-Lived Intermediate in the N2O Generation by P450 NO Reductase Captured by Time-Resolved IR Spectroscopy and XFEL Crystallography. United States: N. p., 2021.
Web. doi:10.11577/1783177.
Nomura, Takashi. Short-Lived Intermediate in the N2O Generation by P450 NO Reductase Captured by Time-Resolved IR Spectroscopy and XFEL Crystallography. United States. doi:https://doi.org/10.11577/1783177
Nomura, Takashi. 2021.
"Short-Lived Intermediate in the N2O Generation by P450 NO Reductase Captured by Time-Resolved IR Spectroscopy and XFEL Crystallography". United States. doi:https://doi.org/10.11577/1783177. https://www.osti.gov/servlets/purl/1783177. Pub date:Tue Feb 09 00:00:00 EST 2021
@article{osti_1783177,
title = {Short-Lived Intermediate in the N2O Generation by P450 NO Reductase Captured by Time-Resolved IR Spectroscopy and XFEL Crystallography},
author = {Nomura, Takashi},
abstractNote = {Diffraction images were collected using an MX300-HS CCD detector. For each cryoloop, 2D raster scan with 50 μm step in each direction was performed twice. In the second pass, the raster-scan grid was shifted 25 μm in each direction. In cheetah directory, - {puck_name}/{pin_id}_hits.h5 correspond to the first scan, and - {puck_name}/{pin_id}-2_hits.h5 correspond to the second scan.},
doi = {10.11577/1783177},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {2}
}
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Works referenced in this record:
Short-lived intermediate in N 2 O generation by P450 NO reductase captured by time-resolved IR spectroscopy and XFEL crystallography
journal, May 2021
- Nomura, Takashi; Kimura, Tetsunari; Kanematsu, Yusuke
- Proceedings of the National Academy of Sciences, Vol. 118, Issue 21