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Title: Chaos in plasma simulation and experiment

Technical Report ·
DOI:https://doi.org/10.2172/10189483· OSTI ID:10189483
 [1];  [2];  [3]
  1. Texas Univ., Austin, TX (United States). Fusion Research Center
  2. Oak Ridge National Lab., TN (United States)
  3. Wisconsin Univ., Madison, WI (United States). Plasma Physics Research

We investigate the possibility that chaos and simple determinism are governing the dynamics of reversed field pinch (RFP) plasmas using data from both numerical simulations and experiment. A large repertoire of nonlinear analysis techniques is used to identify low dimensional chaos. These tools include phase portraits and Poincard sections, correlation dimension, the spectrum of Lyapunov exponents and short term predictability. In addition, nonlinear noise reduction techniques are applied to the experimental data in an attempt to extract any underlying deterministic dynamics. Two model systems are used to simulate the plasma dynamics. These are -the DEBS code, which models global RFP dynamics, and the dissipative trapped electron mode (DTEM) model, which models drift wave turbulence. Data from both simulations show strong indications of low,dimensional chaos and simple determinism. Experimental data were obtained from the Madison Symmetric Torus RFP and consist of a wide array of both global and local diagnostic signals. None of the signals shows any indication of low dimensional chaos or other simple determinism. Moreover, most of the analysis tools indicate the experimental system is very high dimensional with properties similar to noise. Nonlinear noise reduction is unsuccessful at extracting an underlying deterministic system.

Research Organization:
Wisconsin Univ., Madison, WI (United States). Plasma Physics Research
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
FG02-85ER53198
OSTI ID:
10189483
Report Number(s):
DOE/ER/53198-223; ON: DE94001574; BR: AT051011A/AT0530020; TRN: 93:024127
Resource Relation:
Other Information: PBD: Sep 1993
Country of Publication:
United States
Language:
English

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