Interactive Analysis of Gamm-ray Spectra from GE Semiconductor Detectors
GAUSS IX is a tool to interactively analyze gamma-ray spectra from GE Semiconductor detectors. The user has full control over the view of the spectrum being analyzed and the location of the peaks and peak regions. Analysis is performed at user request to the requested peak regions. The fit of a peak region can be previewed before archival or deletion. An iterative procedure is available for calibrating the energy and width equations.
- Short Name / Acronym:
- GAUSS IX
- Project Type:
- Closed Source
- Site Accession Number:
- 3041
- Software Type:
- Scientific
- Research Organization:
- Idaho National Laboratory (INL), Idaho Falls, ID (United States)
- Sponsoring Organization:
- DOE/DPPrimary Award/Contract Number:AC07-05ID14517
- DOE Contract Number:
- AC07-05ID14517
- Code ID:
- 12617
- OSTI ID:
- code-12617
- Country of Origin:
- United States
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