Density changes in amorphous Pd{sub 80}Si{sub 20} during low temperature ion irradiation
Book
·
OSTI ID:99445
- Argonne National Lab., IL (United States). Materials Science Div.
Density changes in amorphous Pd{sub 80}Si{sub 20} during ion irradiation below 100K were detected by in situ HVEM (high voltage electron microscopy) measurements of the changes in specimen length as a function of ion fluence. A decrease in mass density as a function of the ion fluence was observed. the saturation value of the change in mass density was determined to be approximately {minus}1.2%.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 99445
- Report Number(s):
- CONF-941144--; ISBN 1-55899-275-8
- Country of Publication:
- United States
- Language:
- English
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