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Absorbed XFEL Dose in the Components of the LCLS X-Ray Optics

Technical Report ·
DOI:https://doi.org/10.2172/993718· OSTI ID:993718

There is great concern that the short, intense XFEL pulse of the LCLS will damage the optics that will be placed into the beam. We have analyzed the extent of the problem by considering the anticipated materials and position of the optical components in the beam path, calculated the absorbed dose as a function of photon energy, and compared these doses with the expected doses required (i) to observe rapid degradation due to thermal fatigue, (ii) to reach the melting temperature, or (iii) to actually melt the material. We list the materials that are anticipated to be placed into the Linac Coherent Light Source (LCLS) x-ray free electron laser (XFEL) beam line, their positions, and the absorbed dose, and compare this dose with anticipated damage thresholds.

Research Organization:
SLAC National Accelerator Laboratory (SLAC)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76SF00515
OSTI ID:
993718
Report Number(s):
SLAC-TN-10-066
Country of Publication:
United States
Language:
English

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