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Data mining for ontology development.

Technical Report ·
DOI:https://doi.org/10.2172/992328· OSTI ID:992328
;  [1];  [2];  [2];  [2];  [3];  [3];  [2];  [4];  [4];  [4];
  1. Pacific Northwest National Laboratory, Richland, WA
  2. Brookhaven National Laboratory, Upton, NY
  3. Savannah River National Laboratory, Aiken, SC
  4. Oak Ridge National Laboratory, Oak Ridge, TN
+ Show Author Affiliations

A multi-laboratory ontology construction effort during the summer and fall of 2009 prototyped an ontology for counterfeit semiconductor manufacturing. This effort included an ontology development team and an ontology validation methods team. Here the third team of the Ontology Project, the Data Analysis (DA) team reports on their approaches, the tools they used, and results for mining literature for terminology pertinent to counterfeit semiconductor manufacturing. A discussion of the value of ontology-based analysis is presented, with insights drawn from other ontology-based methods regularly used in the analysis of genomic experiments. Finally, suggestions for future work are offered.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
992328
Report Number(s):
SAND2010-3708; TRN: US201022%%361
Country of Publication:
United States
Language:
English

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99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
INFORMATION RETRIEVAL
DATA ANALYSIS
MANUFACTURING
SEMICONDUCTOR DIODES
Ontology.
Information Technology-Data Storage and Data Mining
Data Mining and Knowledge Discovery