Data mining for ontology development.

Technical Report · Tue Jun 01 04:00:00 EDT 2010

DOI:https://doi.org/10.2172/992328· OSTI ID:992328

Davidson, George S; Strasburg, Jana ^[1]; Stampf, David ^[2]; Neymotin, Lev ^[2]; Czajkowski, Carl ^[2]; Shine, Eugene ^[3]; Bollinger, James ^[3]; Ghosh, Vinita ^[2]; Sorokine, Alexandre ^[4]; Ferrell, Regina ^[4]; Ward, Richard ^[4]; Schoenwald, David Alan

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1. Pacific Northwest National Laboratory, Richland, WA
2. Brookhaven National Laboratory, Upton, NY
3. Savannah River National Laboratory, Aiken, SC
4. Oak Ridge National Laboratory, Oak Ridge, TN

A multi-laboratory ontology construction effort during the summer and fall of 2009 prototyped an ontology for counterfeit semiconductor manufacturing. This effort included an ontology development team and an ontology validation methods team. Here the third team of the Ontology Project, the Data Analysis (DA) team reports on their approaches, the tools they used, and results for mining literature for terminology pertinent to counterfeit semiconductor manufacturing. A discussion of the value of ontology-based analysis is presented, with insights drawn from other ontology-based methods regularly used in the analysis of genomic experiments. Finally, suggestions for future work are offered.

• Research Organization: Sandia National Laboratories
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 992328
• Report Number(s): SAND2010-3708
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS
DATA ANALYSIS
Data Mining and Knowledge Discovery
INFORMATION RETRIEVAL
Information Technology-Data Storage and Data Mining
MANUFACTURING
Ontology.
SEMICONDUCTOR DIODES