Flat panel X-ray detector with reduced internal scattering for improved attenuation accuracy and dynamic range
- Santa Fe, NM
- White Rock, NM
- Albuquerque, NM
- Los Alamos, NM
An x-ray detector is disclosed that has had all unnecessary material removed from the x-ray beam path, and all of the remaining material in the beam path made as light and as low in atomic number as possible. The resulting detector is essentially transparent to x-rays and, thus, has greatly reduced internal scatter. The result of this is that x-ray attenuation data measured for the object under examination are much more accurate and have an increased dynamic range. The benefits of this improvement are that beam hardening corrections can be made accurately, that computed tomography reconstructions can be used for quantitative determination of material properties including density and atomic number, and that lower exposures may be possible as a result of the increased dynamic range.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-36
- Assignee:
- The United Sttes of America as represented by the United States Department of Energy (Washington, DC)
- Patent Number(s):
- 7,812,314
- Application Number:
- 12/040,180
- OSTI ID:
- 991713
- Country of Publication:
- United States
- Language:
- English
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