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Betatron motion with coupling of horizontal and vertical degrees of freedom

Journal Article · · Journal of Instrumentation
 [1];  [2]
  1. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
  2. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Presently, there are two most frequently used parameterezations of linear x-y coupled motion used in the accelerator physics. They are the Edwards-Teng and Mais-Ripken parameterizations. The article is devoted to an analysis of close relationship between the two representations, thus adding a clarity to their physical meaning. It also discusses the relationship between the eigen-vectors, the beta-functions, second order moments and the bilinear form representing the particle ellipsoid in the 4D phase space. Then, it consideres a further development of Mais-Ripken parameteresation where the particle motion is descrabed by 10 parameters: four beta-functions, four alpha-functions and two betatron phase advances. In comparison with Edwards-Teng parameterization the chosen parametrization has an advantage that it works equally well for analysis of coupled betatron motion in circular accelerators and in transfer lines. In addition, considered relationship between second order moments, eigen-vectors and beta-functions can be useful in interpreting tracking results and experimental data. As an example, the developed formalizm is applied to the FNAL electron cooler and Derbenev’s vertex-to-plane adapter.
Research Organization:
Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC05-06OR23177
OSTI ID:
991635
Alternate ID(s):
OSTI ID: 21425601
OSTI ID: 990843
Report Number(s):
DOE/OR/23177--1353; JLAB-ACP--10-1251
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 10 Vol. 5; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

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Cited By (1)