Early Results from an Aberration Corrected JEOL 2200FS at Oak Ridge National Laboratory

Journal Article · Fri Dec 01 04:00:00 EST 2006 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927606060570· OSTI ID:989562

Blom, Douglas Allen ^[1]; Allard, Jr, Lawrence Frederick ^[1]; Mishina, Satoshi ^[2]; O'Keefe, Michael A ^[3]

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1. ORNL
2. JEOL USA
3. Lawrence Berkeley National Laboratory (LBNL)

The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element 'aberration correctors.' The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

• Research Organization: Oak Ridge National Laboratory (ORNL); High Temperature Materials Laboratory
• Sponsoring Organization: EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 989562
• Journal Information: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 6 Vol. 12; ISSN 1435-8115; ISSN 1431-9276
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
CHROMATIC ABERRATIONS
CONSTRUCTION
ELECTROMAGNETIC LENSES
ELECTRON MICROSCOPES
GEOMETRICAL ABERRATIONS
LABORATORY BUILDINGS
MODIFICATIONS
MULTIPOLES
ORNL
PERFORMANCE
RESOLUTION