Electron Backscatter Diffraction in Low Vacuum Conditions
Most current scanning electron microscopes (SEMs) have the ability to analyze samples in a low vacuum mode, whereby a partial pressure of water vapor is introduced into the SEM chamber, allowing the characterization of nonconductive samples without any special preparation. Although the presence of water vapor in the chamber degrades electron backscatter diffraction (EBSD) patterns, the potential of this setup for EBSD characterization of nonconductive samples is immense. In this chapter we discuss the requirements, advantages and limitations of low vacuum EBSD (LV-EBSD), and present how this technique can be applied to a two-phase ceramic composite as well as hydrated biominerals as specific examples of when LV-EBSD can be invaluable.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 989345
- Report Number(s):
- LLNL-BOOK-405556
- Country of Publication:
- United States
- Language:
- English
Similar Records
Present State of Electron Backscatter Diffraction and Prospective Developments
USING A MULTI-DISCIPLINARY APPROACH, THE FIRST ELECTRON BACKSCATTERED KIKUCHI PATTERNS WERE CAPTURES FOR A PU ALLOY