Strain induced electronic structure changes in magnetic transition metal oxides thin films

Journal Article · Thu Jul 08 00:00:00 EDT 2010 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.105.067405· OSTI ID:986544

van der Laan, G; Chopdekar, R V; Suzuki, Y; Arenholz, E

We show that the angular dependence of x-ray magnetic circular dichroism (XMCD) is strongly sensitive to strain-induced electronic structure changes in magnetic transition metal oxides. We observe a pronounced dependence of the XMCD spectral shape on the experimental geometry as well as nonvanishing XMCD with distinct spectral features in transverse geometry in compressively strained MnCr{sub 2}O{sub 4} films. The angular dependent XMCD can be described as a sum over an isotropic and anisotropic contribution, the latter linearly proportional to the axial distortion due to strain. The XMCD spectra are well reproduced by atomic multiplet calculations.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: Advanced Light Source Division; Materials Sciences Division
• DOE Contract Number: DE-AC02-05CH11231
• OSTI ID: 986544
• Report Number(s): LBNL-3852E; ISSN 1079-7114; TRN: US1006378
• Journal Information: Physical Review Letters, Vol. 105, Issue 6; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

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CHROMIUM OXIDES
ELECTRONIC STRUCTURE
GEOMETRY
MAGNETIC CIRCULAR DICHROISM
MANGANESE OXIDES
MULTIPLETS
OXIDES
SHAPE
SPECTRA
STRAINS
THIN FILMS
TRANSITION ELEMENTS