A bi-prism interferometer for hard x-ray photons

Journal Article · Tue Apr 06 00:00:00 EDT 2010 · Journal of Synchrotron Radiation

DOI:https://doi.org/10.1107/S0909049510012823· OSTI ID:985826

Isakovic, A F; Siddons, D; Stein, A; Warren, J B; Sandy, A R; Narayanan, M S; Ablett, J M

Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 985826
• Report Number(s): BNL-93875-2010-JA; JSYRES; R&D Project: LS001; KC0401030; TRN: US201016%%2274
• Journal Information: Journal of Synchrotron Radiation, Vol. 17, Issue 4; ISSN 0909-0495
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
COHERENCE LENGTH
FLUORESCENCE
INTERFEROMETERS
PHOTONS
PRISMS
REFRACTIVE INDEX
VISIBILITY