Surface order in cold liquids: X-ray reflectivity studies of dielectric liquids and comparison to liquid metals
Oscillatory surface-density profiles layers have previously been reported in several metallic liquids, one dielectric liquid, and in computer simulations of dielectric liquids. We have now seen surface layers in two other dielectric liquids, pentaphenyl trimethyl trisiloxane, and pentavinyl pentamethyl cyclopentasiloxane. These layers appear below T?285 K and T?130 K, respectively; both thresholds correspond to T/Tc?0.2 where Tc is the liquid-gas critical temperature. All metallic and dielectric liquid surfaces previously studied are also consistent with the existence of this T/Tc threshold, first indicated by the simulations of Chacon et al. The layer width parameters, determined using a distorted-crystal fitting model, follow common trends as functions of Tc for both metallic and dielectric liquids.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 983865
- Report Number(s):
- BNL-93713-2010-JA; R&D Project: LS001; KC0204011; TRN: US201014%%1857
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 81, Issue 18; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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