Spectral Multi-peak Analysis Methodology for Eliminating Effects of NaI Temperature Drift

Conference · Thu Dec 31 23:00:00 EST 2009

OSTI ID:983835

Uckan, Taner ^[1]; March-Leuba, Jose A ^[1]; Brukiewa, Patrick D ^[1]; Upadhyaya, Belle R ^[1]

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1. ORNL

This paper presents a methodology of spectral multi-peak analysis for eliminating temperature drift effects of NaI scintillation gamma-ray detectors. Properties and cost of NaI make it an excellent choice for low energy (< 1-MeV) spectroscopic studies. However, the light output of NaI scintillators has high temperature dependence, and the common practice of selecting a region of interest (ROI) for the peak of study in the measured spectrum requires that NaI temperature drift be monitored and corrected, typically by gain control of the measurement electronics.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: NNSA USDOE - National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 983835
• Country of Publication: United States
• Language: English

Related Subjects

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION
CONTROL
COST
ENERGY
GAIN
PEAKS
PHOSPHORS
PRODUCTION
SCINTILLATIONS
TEMPERATURE RANGE 0400-1000 K
VISIBLE RADIATION